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Content available remote Micromagnetic properties of Co/Pt multilayers deposited on different buffer layers
EN
A study on the buffer layer dependence of the film texture, surface roughness, and magnetization reversal process in Co/Pt multilayers prepared by dc magnetron sputtering is presented. Oxidized Si(100) wafer was covered with four different buffers: (A) 10 nm Cu, (B) 5 nm Ta/10 nm Cu, (C) 5 nm Ta/10 nm Cu/5 nm Ta, and (D) 5 nm Ta/10 nm Cu/5 nm Ta/10 nm Cu. The growth of [2 nm Pt/0.5 nm Co]×5/2 nm Pt on top of these buffer layers results in a large variation in the fcc (111) Co/Pt texture and surface morphology. All films have the perpendicular magnetic anisotropy but magnetization reversal process, studied by the magnetooptic Kerr effect (MOKE) and magnetic force spectroscopy (MFM), strongly depends on the buffer used. Observation of magnetic domains evolution under a MOKE microscope allows one to calculate from magnetization relaxation curves average dispersion of energy barriers of the thermal activated magnetization switching process. The application of MFM in external magnetic field allows one to follow the dynamics of direct and indirect magnetization switching procesess up to submicrometer scale.
2
Content available remote Magnetic properties of (Co/Au)N multilayers with various numbers of repetition N
EN
Magnetization reversal processes and magnetic domain structures have been studied in multilayered systems consisting of magnetostatically coupled cobalt layers separated by non-magnetic/soft-magnetic ones. Observations of the domain structures have been performed at room temperature using Kerr microscopy and magnetic force microscopy technique. The studies have been focused on the key characteristics of magnetic hysteresis loops as well as the domain structures and domain periods in such systems.
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