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Five-wavelength laser microrefractometer

Bodurov I, Yovcheva T, Sainov S

Optica Applicata

2015

Vol. 45, nr 2

199--204

Corresponding author: In this paper, the design and testing of a five-wavelength laser microrefractometer are presented. Five semiconductor lasers are used for the spectral region of 405–1320 nm. The presented device is based on the critical angle method. In this case, the critical angle of total internal reflection is determined with the help of a CCD camera detecting the disappearance of the diffraction pattern, created by a metal diffraction grating. The samples of a thin liquid layer (< 10 μm) are placed between a flint-glass prism and a chromium diffraction grating. The refractive indices of two matching liquid products of Cargille Laboratories are investigated for the approbation of the presented device. The measured values of the refractive indices are used for the dispersion curves construction. The obtained values of the refractive indices are compared with the catalog data given by the manufacturer.