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Metallurgical applications of electron back-scattering patterns.

Hutchinson B., Ryde L., Lindh E.

Inżynieria Materiałowa

1998

R. XIX, nr 3

124-129

One of the most interesting developments in the area of quantitive metallography has been the possibility of obtaining diffraction patterns (electron back-scattering patterns or EBSPs) in the scanning electron microscope. The presentation gives a short description of the EBSP method and also the way in which it can be combined with automatic movement of the electron beam position to create an orientation imaging micrograph (OIM). Examples are then given of various applications of the EBSP/OIM method to practical problems relating to industrial metallic materials.