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Is Timed Branching Bisimilarity a Congruence Indeed?

Fokkink W., Pang J., Wijs A.

Fundamenta Informaticae

2008

Vol. 87, nr 3-4

287-311

We show that timed branching bisimilarity as defined by Van der Zwaag [17] and Baeten and Middelburg [2] is not an equivalence relation, in case of a dense time domain. We propose an adaptation based on Van der Zwaag’s definition, and prove that the resulting timed branching bisimilarity is an equivalence indeed. Furthermore, we prove that in case of a discrete time domain, Van der Zwaag’s definition and our adaptation coincide. Finally, we prove that a rooted version of timed branching bisimilarity is a congruence over a basic timed process algebra containing parallelism, successful termination and deadlock.

An efficient information system for automated process planning

Pang J., Harrison D. K., MacDonald M.

Mechanics and Mechanical Engineering

2002

Vol. 6, nr 2

49-63

Process planning is one of the most important components in manufacturing industry. It may be considered as a bridge between design and manufacturing. Tremendous efforts have been made to develop automated process planning systems during the last three decades. However, their effectiveness is stili far from satisfactory. Process planning is a very complicated and complex task. It not only requires a good deal of technique specific expertise and knowledge but also is very dependent on dynamic manufacturing resources. With the recent development in computer information systems, especially Artificial Intelligence (Al) and advanced modelling techniques, Computer Aided Process Planning (CAPP) has greatly benefited from the new information processing capabilities. By efficiently combining some of these techniques such as object-oriented techniques, deductive mechanisms, logic programming and fuzzy logic, an integrated and intelligent information representation is introduced to facilitate automatic process planning in this paper. It can effectively satisfy the requirements of representing the process planning information and also provide an open structure for the information exchange within the Computer Integrated Manufacturing (CIM) environment.