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Study of the optical rotatory of potassium titanyl phosphateusing the advanced dual-wavelength polarimetric method

Shopa Mykola, Ftomyn Nazar, Shopa Yaroslav

Opto-Electronics Review

2024

Vol. 32, No. 4

art. no. e152682

A dual-wavelength high-accuracy universal polarimeter was applied to the circularbirefringence and optical activity measurement in potassium titanyl phosphate (KTP)nonlinear crystal. The experimental setup used two single-mode He-Ne lasers with close wavelengths of 594 and 633 nm as light sources. Measurement has been carried out for two crystal settings in directions of a 45-degree relative angle to the [100] and [010]crystallographic axes. Multiple light reflections inside the crystal sample were considered when processing the results of the polarimetric measurements. The results have been analysed using the optical transmission function for the polariser-sample-analyser system, and 2D intensity contour maps made it possible to determine the phase parameters, systematic errors, and eigenwaves ellipticity. It was found that the gyration tensorcomponent of the KTP crystal is equal to g₁₂ = 1.4 ⋅10⁻⁵ which in terms of optical rotatory power corresponds to the very small magnitude of the rotation value of 2.3 deg/mm.

Imaging polarimeter with high-accuracy measuring principles in crystal optics

Shopa Mykola, Kobyakov Serhiy, Shopa Yaroslav

Opto-Electronics Review

2022

Vol. 30, No. 3

art. no. e141948

An imaging polarimeter based on the principles of high-accuracy polarimetry well known in crystal optics is proposed. The application of scientific digital cameras for performance light measurements leads to precise data on polarizers quality, i.e., maps of extinction ratio and transmission axis. Processing of numerous images, acquired at various settings in the polarizer-sample-analyser system, allows to determine the two-dimensional distribution of the phase retardation of birefringent plates. Several results of imaging polarimetry experiments on birefringent plates demonstrate the impact of multiple light reflections on the measured phase retardation values. Experimental data for LiNbO₃ and SiO₂ crystal plates have been presented, demonstrating the capabilities of the proposed type of imaging polarimeter in the crystal optics studies. This technique also allows the measurement of the eigen wave ellipticities, associated with the optical activity of crystals.