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Application of atomic force microscopy in analysis of material surfaces

Konstantová V.

Zeszyty Naukowe Politechniki Świętokrzyskiej. Nauki Techniczne

2011

Z. 16

47-55

Atomic Force Microscopy (AFM) is from the family of Scanning Probe microscopy common used technique for imaging analysis of material. This paper describe fundamentals of Atomic Force Microscopy - contact, semicontact and noncontact mode. Topography by semicontact mode will be presented by scan images of different type of materials, biological and technical. This work was done with the financial support of the VEGA project n. 1/0564/10 "Research of Structures, Morphologies of Surface and Properties of Nature Materials as Source of Inspiration for Non-conventional constructional Materials".