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2 Nukleonika

2 2012

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Wettability of carbon and silicon carbide ceramics induced by their surface alloying with Zr and Cu elements using high intensity pulsed plasma beams

Barlak M., Piekoszewski J., Sartowska B., Waliś L., Starosta W., Kierzek J., Pochrybniak C., Kowalska E.

Nukleonika

2012

Vol. 57, No. 4

477-483

Joining of metals with ceramics is very difficult, because properties of these materials are very different. One of the methods of improving mechanical strength of the obtained joints is the introduction of an additional interlayer to the joining area. This paper presents the Zr and Cu-rich layers in C and SiC substrates obtained using the high intensity pulsed plasma beams method. The results of Zr plasma modifications were beneficial and similar to the results obtained in previous works with Ti. The measured contact angles were below 90 centigrade. The results with Cu plasma were unfavourable with contact angles close to 180 centigrade. Apart from the sessile-drop test and to extend the range of analysis, the investigated samples were examined by stereoscopic optical microscopy (OM), scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDXS), grazing angle X-ray diffraction (GXRD), and Rutherford back scattering (RBS) measurements.

High - temperature oxidation resistance in yttrium implanted stainless steel

Barlak M., Piekoszewski J., Werner Z., Sartowska B., Waliś L., Starosta W., Kierzek J., Kowalska E., Wilhelm R. A., Pochrybniak C., Woźnica M.

Nukleonika

2012

Vol. 57, No. 4

473-476

Austenitic AISI 304, 316L and ferritic 430 stainless steels were implanted with yttrium to fluences ranging between 1 x 1015 and 5 x 1017 ions/cm2. The samples were subjected to oxidation in air at a temperature of 1000 centigrade for a period of 100 h and next examined by stereoscopic optical microscopy (OM), scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDX) and Rutherford back scattering spectrometry (RBS). The results obtained with the use of ion implantation are discussed.