Polycrystalline Cadmium sulfide (CdS) films were deposited onto Corning glass substrates from alkaline solutions containing CdCl2, KOH, Na3C6H5O7 and CS(NH2)2 at different deposition times (10, 20, 30, 40 and 50 min), bath temperatures (80 ±2 °C) and different concentration of the reactants. A comparative study was performed out on thin film via optical transmission and X-ray diffraction (XRD) measurements. The results which reveal that the deposition time has a profound influence on the growth rate and band gap of the deposited layers. Diffraction data was used to evaluate the lattice parameter, grain size, average strain, number of crystallites per unit area and dislocation density in the film are calculated.
The paper presents a study regarding the kinetic of chemical bath deposition (CBD) PbS nano films. Nano films were deposited from chemical bath containing thiourea, lead nitrite, and ammonia. The deposition kinematics and optical investigations have been performed to compare the properties of the films grown with different precursor solutions. We are able to determine the growth rate as a function of the synthesis conditions and it was found that the growth rate of deposited nano layer affected significantly by synthesis conditions. The main characteristic of nano films is the band gap. This parameter determined from spectroscopy Measurements of transmission, in the energy range of 240-840 nm is influenced by many factors such as deposition time, bath temperature, pH value of the path and molar concentration of the reactants.
Polycrystalline Cadmium sulfide (CdS) films were deposited onto Corning glass substrates from alkaline solutions containing CdCl2, KOH, Na3C6H5O7 and CS(NH2)2 at different deposition times (10, 20, 30, 40 and 50 min), different bath temperatures and different concentration of the reactants. A comparative study was performed out on thin film via optical transmission and X-ray diffraction (XRD) measurements which reveal that the deposition time has a profound influence on the growth rate and band gap of the deposited layers. Diffraction data are used to evaluate the lattice parameter, grain size, average strain, number of crystallites per unit area and dislocation density in the film are calculated.
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