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Modification of the Structure and Properties of FeSiB Amorphous Ribbon by Interference Pulsed Laser Heating

Czyż O., Kusiński J., Radziszewska A., Ostrowski R., Morgiel J., Kanak J., Kąc M.

Archives of Metallurgy and Materials

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2018

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Vol. 63, iss. 4

2001--2007

EN

Paper describes the results of Fe80Si11B9 amorphous ribbon investigation after pulsed laser interference heating and conventional annealing. As a result of interference heating periodically placed laser heated microareas were obtained. Structure characterisation by scanning and transmission electron microscopy showed in case of laser heated samples presence of crystalline nanostructure in amorphous matrix. Microscopy observations showed significant difference in material structure after laser heating – nanograin structure, and material after annealing – dendritic structure. Magnetic force microscopy investigation showed expanded magnetic structure in laser heated microareas, while amorphous matrix did not give magnetic signal. Change of magnetic properties was examined by magnetic hysteresis loop measurement, which showed that the laser heating did not have a significant influence on soft magnetic properties.

2

Structure and properties of Al-Cu-Fe thin films deposited by PLD technique

Kąc S., Kąc M.

Inżynieria Materiałowa

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2010

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Vol. 31, nr 3

382-385

EN

In this paper the results of the investigations of Al-Cu-Fe thin films obtained by PLD technique are presented. The films were deposited using different parameters of process (e.g. substrate temperature, laser fluence). The morphology and chemical composition of obtained surface layers was examined. In the frames of the investigations the thickness measurements, the nanohardness and adhesion tests of the Al-Cu-Fe layers was performed.

PL

W publikacji przedstawiono wyniki badań cienkich warstw Al-Cu-Fe wytwarzanych techniką PLD. Cienkie warstwy były osadzane z zastosowaniem rożnych parametrów procesu (np. temperatura podłoża, gęstość energii wiązki lasera). Badano morfologię oraz skład chemiczny otrzymanych cienkich warstw. W ramach badań wykonano pomiary grubości, nanotwardości oraz testy adhezji do podłoża cienkich warstw Al-Cu-Fe.

3

Specular and diffuse X-ray reflectivity study of surfactant mediated Co/Cu multilayers

Marszałek M., Kąc M., Krupiński M., Polit A., Zabila Y.

Materials Science Poland

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2008

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Vol. 26, No. 3

735--741

EN

The application of X-ray techniques for studies of the interface structure of Co/Cu multilayers has been presented with a pre-deposited ultrathin film of Bi and Pb. The [Co(1 nm)/Cu(2 nm)] multilayers were thermally evaporated at very low deposition rates with a small amount of Bi and Pb surfactant (about 0.2 ML) introduced at each Cu layer. The structure of Co/Cu multilayers with added surfactant has been studied using low-angle specular and nonspecular X-ray reflectivity. In all studied specimens, the off-specular reflectivity replicates some of the features of specular reflectivity. The presence in diffuse spectra of a Bragg peak due to coherent scattering, as well as visible finite thickness clearly indicates a high degree of conformality and interface roughness replication in the surfactant mediated Co/Cu multilayers. X-ray reflectivity as well as X-ray diffuse scattering measurements showed a distinct variation in the structure of the multilayers with introduction of surfactant which leads to well-ordered periodic structures with small roughness.

4

The AlMg thin films deposited by using PLD technique

Radziszewska A., Kąc S., Kąc M.

Inżynieria Materiałowa

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2007

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Vol. 28, nr 3-4

720-723

EN

In the paper the systematic study of the pulsed laser deposition of P-Mg2Al3 has been carried out. The AlMg thin films were prepared on Si (100) substrates and deposited by using a Nd:YAG laser (k = 355 nm). The samples were performed with two different laser beam energy densities (4,7 and 10 J/cm2) and two different substrate (Si) temperatures (room temperature and 430 °C). The deposition time was kept at 30 min. The variation of structure, chemical composition and surface roughness of the deposited thin films is discussed. Structure and chemical composition investigation showed that the films possess generally nanocrystalline structure and that the quantity of Al and Mg changes along the film depth. The surface topography of films was varied as result of changing of the fluence value and the substrate temperature.

PL

W artykule zostały przeprowadzone systematyczne studia na temat nakładania cienkich warstw P-Mg2Al3 techniką PLD. Cienkie warstwy AlMg były nakładane, na płytki krzemowe (100), za pomocą lasera Nd:YAG ((A. = 355 nm). Próbki wykonano stosując dwie różne gęstości energii promieniowania laserowego(4,7 i 10 J/cm2) oraz różną temperaturę podłoża (Si) (20 °C i 430 °C). Czas nakładania warstw wynosił 30 min. Przedyskutowano zmiany struktury, składu chemicznego oraz chropowatości powierzchni cienkich warstw. Badania strukturalne i składu chemicznego pokazują że warstwy głównie posiadają nanokrystaliczną strukturę oraz zmiany zawartości Al i Mg na przekroju warstwy. Zastosowanie różnych gęstości energii promieniowania laserowego oraz różnej temperatury podłoża powoduje modyfikację topografii powierzchni uzyskanych warstw.

5

Spektroskopia elektronów Augera (AES) w badaniach wzrostu cienkich warstw na przykładzie warstw Co/Cu na Si(100)

Jaworski J., Marszałek M., Marszałek K., Kąc M.

Prace Naukowe Politechniki Warszawskiej. Elektronika

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2002

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z. 143

73-78

EN

In this paper we have investigated the growth of components Co/Cu multilayers and different buffer layers (Cu,Pb) on the Si (100) substrate using peak-to-peak method of Auger Electron Spectroscopy. We have observed that even so simple systems like single Co and single Cu layers on Si substrate show a very complicated type of growth, which changes with the thickness of evaporated metal. During growth of Co/Cu multilayers on the Cu buffer, disposition of Co results in coarsening of the system surface. In contrary, Cu desposition leads to the increase of the surface roughness. The Pb buffer layer complicates the structure of the system. Segregation of the Pb to the surface of the sample can result in the formation of metal precipitates. Peak-to-peak method brings valuable information about type of the metal growth, and proposed normalization method allows a proper interpretation of results. However, it does not apply to metals that segregate to the system surface.

6

Korelacja własności magnetycznych i struktury Fe-Cr

Kąc M., Karaś W., Ślęzak T., Korecki J.

Prace Naukowe Politechniki Warszawskiej. Elektronika

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2002

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z. 143

171-174

EN

Conversion electron Mossbauer spectroscopy (CEMS) was applied to study Fe ultrathin films and Fe/Cr, Cr/Fe interfaces. Based on alloy model in which the Cr atom in the first and second Fe coordination shell decreases the Fe hyperfine field, we are able to show that the Cr/Fe ("lower") interface is smoother than the Fe/Cr ("upper") one. The Fe atoms are distributed over 1 and 2 atomic layers in the lower and upper interfaces, respectively. The CEMS studies were correlated with the magneto-optic Kerr effect measurements of an indirect exchange coupling in Fe/Cr multilayers. In the Fe/Cr/Fe trilayers the antiferromagnetic and non-collinear coupling was observed for the 8 ML and 20 ML Cr spacer thickness, respectively.