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EN
In order to tailor microstructure to archieve predetermined properties it is necessary to understand and control the processing-structure-property relationships, which is the heart of material science. Electron microscopy has become one of the primary methods of characterizing the micro- and mesostructures of materials, due to its high resolution capabilities now approaching 1A, in real space. In addition, by monitoring the signals generated by both elastic and inelastic scattering, detailed information is also obtainable on the crystal structure and composition of the specimen down to very small volumes, so facilitating analyses of nanostructures, thin films and multilayers in addition to analyses of specimens of bulk materials. In this paper some representative examples of the applications of the electron microscopy towards tailoring microstructure are summarized.
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