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1 Bulletin of the Polish Academy of Sciences. Technical Sciences

1 2010

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Advanced microstructure diagnostics and interface analysis of modern materials by high-resolution analytical transmission electron microscopy

Neumann W., Kirmse H., Hausler I., Mogilatenko A., Zheng C., Hetaba W.

Bulletin of the Polish Academy of Sciences. Technical Sciences

2010

Vol. 58, nr 2

237-253

Transmission electron microscopy (TEM) is a powerful diagnostic tool for the determination of structure/property relationships of materials. A comprehensive analysis of materials requires a combined use of a variety of complementary electron microscopical techniques of imaging, diffraction and spectroscopy at an atomic level of magnitude. The possibilities and limitations of quantitative TEM analysis will be demonstrated for interface studies of the following materials and materials systems: Nickel-based superalloy CMSX-10, (Zn,Cd)O/ZnO/Al2O3, (Al,Ga)N/AlN/Al2O3, GaN/LiAlO2 and FeCo-based nanocrystalline alloys.