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Theoretical spectroscopic scan of the sensitivity of asymmetric slab waveguide sensors

El-Agez T., Taya S.

Optica Applicata

2011

Vol. 41, nr 1

89--95

An extensive theoretical analysis is carried out to investigate the variation of the sensitivity of optical slab waveguide sensors with the wavelength of the guided wave. We consider a three-layer waveguide as an optical sensor. The sensitivity for both polarizations of light: s-polarized light (TE) and p-polarized light (TM), is derived using the characteristic equation of the structure. The dispersion of the materials is taken into account to study the sensitivity spectroscopic scan over the near IR-range from 1.2–2 žm. It is found that an optimum wavelength exists for each guiding layer thickness and this optimum value increases linearly with the thickness of the guiding layer.

A polynomial approach for reflection, transmission, and ellipsometric parameters by isotropic stratified media

El-Agez T., Taya S., El Tayyan A.

Optica Applicata

2010

Vol. 40, nr 2

501--510

A polynomial approach for the calculation of the reflectance, the transmittance, and the ellipsometric parameters of a stratified isotropic planar structure is presented. We show that these parameters can be written in a very simple and compact form using the so-called elementary symmetric functions that are extensively used in the mathematical theory of polynomials. This approach is applied to quarter-wave Bragg reflectors. The numerical results reveal an exact match with the well known matrix formalism.