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Optimal parameters of a dynamically loaded patch/layer structure against the elastic-brittle interface debonding

Ivanova J., Petrova T., Kirilova E., Becker W.

Engineering Transactions

2017

Vol. 65, iss. 1

97--103

A one-dimensional shear-lag model was developed to study the high frequency, dynamic, time-harmonic mechanical behavior of the overlap zone of a piezoelastic patch attached to an elastic host layer and subjected to electric, temperature and moisture excitation. It was interesting to see that the change of the geometry of the overlap zone leads to different solutions after some frequency, which is responsible for different dynamic behavior of the considered structure. Furthermore, the model was involved in an optimization framework (genetic algorithm-GA) in order to find the optimal values of the model parameters of the patch/layer configuration.

Luminescence and structural properties of thermally evaporated benzanthrone dyes thin films

Bulanovs A., Kirilov G., Fleisher M., Kirilova E., Mihailova I.

Opto-Electronics Review

2013

Vol. 21, No. 2

227-232

We report optical and luminescence properties of 3-N, N-diacetylaminobenzanthrone thin films deposited on glass substrate by thermal evaporation. The structural and optical properties of organic thin films were studied by means of the confocal microscope with an input of femtosecond laser radiation, X-ray diffractometer, and scanning electron microscope (SEM). Intense luminescence with the maximum at 530 nm was observed when excited by laser radiation with the wavelengths 458, 476, 488, 496, 514 nm. In addition, the luminescence caused by two-photon absorption of femtosecond (fs) laser radiation has been investigated. Semi empirical calculations by AM1 and ZINDO/S methods and ab initio calculations using Gaussian software were carried out to estimate the electron system of structure. The calculations show planar configurations for the aromatic core and diacetylamino fragment of this compound. The study of the structure of benzanthrone derivative thin films with X-ray diffraction (XRD) methods, indicates the distance between molecular layers and ordered molecular fragments.