Wyniki wyszukiwania - BazTech

Ograniczanie wyników

1 Metrology and Measurement Systems

1 2021

Powiadomienia systemowe

Sesja wygasła!

Znaleziono wyników: 1

Liczba wyników na stronie

Wyniki wyszukiwania

Sortuj według:

Ogranicz wyniki do:

Layer thickness measurement of technically anodised aluminium surfaces by using goniometric scattered light

Geisler Tobias, Manns Martin

Metrology and Measurement Systems

2021

Vol. 28, nr 2

371--382

In recent years, scattered light measurement technology has developed into a common method for measuring roughness, form and waviness on precision machined surfaces. Meanwhile, the application for the material structure evaluation of electrolytically anodized surfaces has also been considered. In this context, we present a novel approach to layer thickness measurement of naturally anodised aluminium surfaces. Our approach is based on the reflection intensity of the light beam, which penetrates the oxide layer and is reflected back from the surface as well as from the layer base. In the approach, a model for estimating reflection intensity I from the absorption coefficient is employed. The methodology is tested by comparing results to a layer thickness evaluation using metallographic preparation. Based on the proposed approach, we are able to measure intervals of layer thicknesses on naturally anodized aluminium surfaces without contact.