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Optical and Structural Properties of Cu2O thin Film as Active Layer in Solar Cells Prepared by DC Reactive Magnetron Sputtering

Sawicka-Chudy P., Wisz G., Sibiński M., Cholewa M., Potera P., Głowa Ł., Pawełek R.

Archives of Metallurgy and Materials

2019

Vol. 64, iss. 1

243--250

A series of copper oxide thin films were synthesized through direct current magnetron sputtering on glass and silicon substrates with various process parameters. Initially, optical microscopy images and their histograms were analyzed to determine the optical quality of the obtained layers and then histograms were created using Image Histogram Generator software. Next, the morphology, and cross-section and layer composition of the samples were evaluated. Finally, the transmission spectra of the thin films were recorded. Transmittance and reflection spectra of the UV–vis analysis were utilized to calculate the optical band gap, the extinction coefficient, and the absorption coefficient of the oxidized layers. Samples showed low transmittance (up to 40%) in the region of 400 to 1000 nm. The mean absorption coefficient varied from ~3 · 105 to ~6 · 105 1/cm and from ~2 · 105 to ~4 · 105 1/cm in the region of 2 eV to 3.5 eV. The extinction coefficient ranged from 0 to 0.11 in the region from 300 to 3000 nm. Reflectance of the samples was ~20% in the region of 1000 to 2500 nm and ranged from 20%-50% in the region of 1000 to 3000 nm. We verified the process parameters of the Cu2O structure to improve the quality as a buffer layer. On the basis of this preliminary analysis, we propose the most promising and future-oriented solutions in photovoltaic applications.

Analysis of chemical and phase composition of copper oxide prepared by direct current sputtering for photovoltaic applications

Sawicka-Chudy P., Wielgosz M., Wal A., Cieniek B., Wisz G., Głowa Ł., Cholewa M., Sawicka J.

Energy Policy Studies

2018

No. 1 (2)

3--11

This paper presents the application of X-ray fluorescence and X-ray diffraction methods for the study of copper oxide structures as an absorber layer in thin-film solar cells. The layers of copper oxide were applied by direct current magnetron sputtering. Quantitative and qualitative analysis of oxide layers were performed using XRF (X-ray fluorescence). The studies showed a high copper content in both samples, amounting to 98% and 96%, as well as trace amounts of other elements (nickel, lead). The XRD (X-ray diffraction) study showed Cu20 and Cu8O phases, amorphism ranging from 24% to 44%, and crystallinity from 55% to 75%. Crystallites of 30 nm were also determined. The aim of the study was to determine the chemical and phase composition of the layers obtained and to determine the degree of their contamination depending on the parameters of the manufacturing technology in terms of their application in photovoltaics. One of the samples showed an advantage both in terms of material and structural composition.