New Data on the Epstein to Single Sheet Tester Relationship

• Autorzy: Sievert J. , Belgrand T. , Fox D. , Guo X. , Kochmann T. , Lyke R. , Wang C. , Zhou X.

Warianty tytułu

PL

Nowe badania relacji między wynikami pomiarów metodą Epsteina a metodą testera próbek arkuszowych SST

• Języki publikacji: EN

Abstrakty

EN

Fifteen years ago, the Epstein frame to the independent Single Sheet Tester (SST92) relation was determined using a large number of correlated grain-oriented samples [1], and the results are reflected in Annex C of IEC standard 60404-3 [2]. Whilst those results were achieved using the same equipment of one reference laboratory, the new data originate from measurements on sample pairs from different manufactures using their own measuring equipment. The resulting Epstein to SST92 ratios show slightly higher values than the old ones, and a considerable dispersion. The reasons for these phenomena are discussed and further experiments for their clarification proposed.

PL

Piętnaście lat temu zaprezentowano porównanie wyników badań różnych próbek blach elektrotechnicznych wykonanych metoda Epsteina i przy wykorzystaniu testera próbek arkuszowych SST92. Wyniki pochodziły z badania próbek w tym samym laboratorium. Nowe wyniki zaprezentowane w pracy przedstawiają badania różnych próbek w różnych laboratoriach. Otrzymano nieco większy rozrzut zmierzonych wartości. W artykule analizuje się przyczyny tych różnic.

Słowa kluczowe

EN

electrical sheet steel; measurement of properties; Epstein frame

PL

blachy elektrotechniczne; rama Epsteina; tester próbek arkuszowych SST

• Wydawca: Wydawnictwo SIGMA-NOT
• Czasopismo: Przegląd Elektrotechniczny
• Rocznik: 2013
• Tom: R. 89, nr 7
• Strony: 1--3
• Opis fizyczny: Bibliogr. 8 poz., wykr.

Twórcy

autor

Sievert J.

• former affiltn.: Magnetic Measurements Lab., PTB Braunschweig

autor

Belgrand T.

• Thyssenkrupp Electrical Steel, Isbergues

autor

Fox D.

• Cogent-Power, Newport

autor

Guo X.

• Wuhan Iron and Steel Corp.

autor

Kochmann T.

• Thyssenkrupp Electrical Steel Bochum

autor

Lyke R.

• AK Steel, West Chester

autor

Wang C.

• Thyssenkrupp Electrical Steel. Gelsenkirchen

autor

Zhou X.

• Baosteel Corp., Shanghai

Bibliografia

• [1] J. Sievert: The Measurement of Magnetic Properties of Electrical Sheet Steel – Survey of Methods and Standards. SMM14, J.Magn.Magn. Mater 215-216 (2000) 647-651
• [2] IEC Publ.60404-3 Ed. 2.2 (2010): Magnetic materials – Part 3: Methods of measurement of the magnetic properties of electrical steel strip and sheet by means of a single sheet tester.
• [3] IEC Publ.60404-2 Ed. 3.1 (2008): Magnetic materials – Part 2: Methods of measurement of the magnetic. properties of electrical steel strip and sheet by means of an Epstein frame.
• [4] J. Sievert, H. Yang, P. Zhang and H. Ge: Studies on the systematic error of Epstein measurements. XII. Int. Workshop on 1- and 2-dim. magnetic measurements and testing, Vienna 2012, submitted for publication in the IJAEM
• [5] J.Sievert, H. Ahlers: Epstein to SST relationship – statistical rather than deterministic. XI. Int. Workshop on 1- and 2-dim. magnetic measurements and testing, Oita 2010, Electrical Review vol 9b/2011,R.87, p.17-19
• [6] J. Sievert, H. Ahlers:Is the Epstein frame replaceable? SMM9 Conference, Madrid 1989, Anales de Fisica Serie B, vol. 86 (1990), p. 58-63
• [7] J. Sievert, H. Ahlers, F. Fiorillo, M. Hall , L. Henderson and L. Rocchino: Magnetic measurements on electrical steels using epstein and sst methods - euromet comparison between standard laboratories. Procs. of the 6th Int.Workshop on 1&2- dimensional measurement and testing, Bad Gastein, Sept. 2000, ed. H. Pfützner, Vienna Magnetic Groups Reports, ISBN 3-902105-00-3, Vienna 2002, p. 194-203
• [8] J. Sievert, H. Ahlers, P. Brosin, M. Cundeva and J. Luedke: Relationship of Epstein to SST Results for Grain-Oriented Steel. 9th ISEM Conference, Pavia, Italy, May 1999, in: A.Savini (editor):Non-Linear Electromagnetic Systems, Advanced Techniques and Mathematical Methods, Studies in Applied Electromagnetics and Mechanics, IOS Press, Amsterdam, Niederlande, Vol. 18(2000)3-6