PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Tytuł artykułu

Two-step dual-wavelength interferometry for surface relief retrieval

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The new two-step dual-wavelength interferometry method that uses only two pairs of interferograms for surface relief retrieval is proposed. In this method, two interferograms in each pair are differed only by an arbitrary phase shift of a reference wave. The method allows using only one out-of-plane shift of a reference wave to record each second interferogram in both pairs, since arbitrary phase shifts between interferograms in each pair can be defined by calculation of the correlation coefficient between two interferograms. This method can extract separately areal surface roughness and areal waviness phase maps from a phase map of the total surface relief and reduce errors produced during the surface relief retrieving. Computer simulation and experimental verification have confirmed the reliability of the proposed method.
Czasopismo
Rocznik
Strony
331--343
Opis fizyczny
Bibliogr. 16 poz., rys.
Twórcy
  • Karpenko Physico-Mechanical Institute of the NAS of Ukraine, 5 Naukova St., 79060 Lviv, Ukraine
  • Karpenko Physico-Mechanical Institute of the NAS of Ukraine, 5 Naukova St., 79060 Lviv, Ukraine
  • Karpenko Physico-Mechanical Institute of the NAS of Ukraine, 5 Naukova St., 79060 Lviv, Ukraine
  • Karpenko Physico-Mechanical Institute of the NAS of Ukraine, 5 Naukova St., 79060 Lviv, Ukraine
Bibliografia
  • [1] CHENG Y.-Y., WYANT J.C., Two-wavelength phase shifting interferometry, Applied Optics 23(24), 1984, pp. 4539–4543, DOI: 10.1364/AO.23.004539.
  • [2] COCHRAN E.R., CREATH K., Combining multiple-subaperture and two-wavelength techniques to extend the measurement limits of an optical surface profiler, Applied Optics 27(10), 1988, pp. 1960–1966, DOI: 10.1364/AO.27.001960.
  • [3] PARSHALL D., KIM M.K., Digital holographic microscopy with dual-wavelength phase unwrapping, Applied Optics 45(3), 2006, pp. 451–459, DOI: 10.1364/AO.45.000451.
  • [4] TAY C.J., QUAN C., NIU H., BHADURI B., Phase retrieval in two-wavelength DSSI using a combined filtering method, Optik 122(23), 2011, pp. 2114–2118, DOI: 10.1016/j.ijleo.2011.01.007.
  • [5] XIAOQING XU, YAWEI WANG, YUANYUAN XU, WEIFENG JIN, Dual-wavelength in-line phase-shifting interferometry based on two dc-term-suppressed intensities with a special phase shift for quantitative phase extraction, Optics Letters 41(11), 2016, pp. 2430–2433, DOI: 10.1364/OL.41.002430.
  • [6] XIAOQING XU, YAWEI WANG, YING JI, YUANYUAN XU, MING XIE, HAO HAN, A novel dual-wavelength iterative method for generalized dual-wavelength phase-shifting interferometry with second-order harmonics, Optics and Lasers in Engineering 106, 2018, pp. 39–46, DOI: 10.1016/j.optlaseng.20 18.02.007.
  • [7] KUMAR U.P., BHADURI B., KOTHIYAL M.P., MOHAN N.K., Two-wavelength micro-interferometry for 3-D surface profiling, Optics and Lasers in Engineering 47(2), 2009, pp. 223–229, DOI: 10.1016/ j.optlaseng.2008.04.005.
  • [8] MURAVSKY L.I., OSTASH O.P., KMET’ A.B., VORONYAK T.I., ANDREIKO I.M., Two-frame phase-shift-ing interferometry for retrieval of smooth surface and its displacements, Optics and Lasers in En-gineering 49(3), 2011, pp. 305–312, DOI: 10.1016/j.optlaseng.2010.11.021.
  • [9] MURAVSKY L., PICART P., KMET’ A., VORONYAK T., OSTASH O., STASYSHYN I., Evaluation of fatigue process zone dimensions in notched specimens by two-step phase shifting interferometry technique, Optical Engineering 55(10), 2016, article ID 104108, DOI: 10.1117/1.OE.55.10.104108.
  • [10] MURAVSKY L.I., KMET’ A.B., VORONYAK T.I., Retrieving the relief of a low-roughness surface using a two-step interferometric method with blind phase shift of a reference wave, Optics and Lasers in Engineering 50(11), 2012, pp. 1508–1516, DOI: 10.1016/j.optlaseng.2012.06.011.
  • [11] MURAVSKY L., KMET’ A., VORONYAK T., Two approaches to the blind phase shift extraction for two-step electronic speckle pattern interferometry, Optical Engineering 52(10), 2013, article ID 101909, DOI: 10.1117/1.OE.52.10.101909.
  • [12] AEBISCHER H.A., WALDNER S., A simple and effective method for filtering speckle-interferometric phasefringe patterns, Optics Communications 162(4–6), 1999, pp. 205–210, DOI: 10.1016/S0030-4018(99)00116-9.
  • [13] XIA YANG, QIFENG YU, SIHUA FU, An algorithm for estimating both fringe orientation and fringe density, Optics Communications 274(2), 2007, pp. 286–292, DOI: 10.1016/j.optcom.2007.02.020.
  • [14] MURAVSKY L.I., KMET’ A.B., STASYSHYN I.V., VORONYAK T.I., BOBITSKI Y.V., Three-step interferometric method with blind phase shifts by use of interframe correlation between interferograms, Optics and Lasers in Engineering 105, 2018, pp. 27–34, DOI: 10.1016/j.optlaseng.2017.12.011.
  • [15] RAJA J., MURALIKRISHNAN B., SHENGYU FU, Recent advances in separation of roughness, waviness and form, Precision Engineering 26(2), 2002, pp. 222–235, DOI: 10.1016/S0141-6359(02)00103-4.
  • [16] WANGPING ZHANG, XIAOXU LU, LEIHUAN FEI, HUI ZHAO, HANLING WANG, LIYUN ZHONG, Simultaneous phase-shifting dual-wavelength interferometry based on two-step demodulation algorithm, Optics Letters 39(18), 2014, pp. 5375–5378, DOI: 10.1364/OL.39.005375.
Uwagi
PL
Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2019).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-fc77ce04-1d37-4f1e-b7e1-d56c0d59de2e
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.