The Impact of Noise and Mismatch on SAR ADCs and a Calibratable Capacitance Array Based Approach for High Resolutions

• Autorzy: Mueller J. H. , Strache S. , Busch L. , Wunderlich R. , Heinen S.

Identyfikatory

DOI

10.2478/eletel-2013-0019

• Języki publikacji: EN

Abstrakty

EN

This paper describes widely used capacitor structures for charge-redistribution (CR) successive approximation register (SAR) based analog-to-digital converters (ADCs) and analyzes their linearity limitations due to kT/C noise, mismatch and parasitics. Results of mathematical considerations and statistical simulations are presented which show that most widespread dimensioning rules are overcritical. For high-resolution CR SAR ADCs in current CMOS technologies, matching of the capacitors, influenced by local mismatch and parasitics, is a limiting factor. For high-resolution medium-speed CR SAR ADCs, a novel capacitance array based approach using in-field calibration is proposed. This architecture promises a high resolution with small unit capacitances and without expensive factory calibration as laser trimming.

Słowa kluczowe

EN

analog-digital conversion; analog-digital integrated circuits; calibration; CMOS integrated circuits; mathematical model; MATLAB; mixed analog digital integrated circuits; noise; numerical simulation; prediction methods

• Wydawca: Polish Academy of Sciences, Committee of Electronics and Telecommunication
• Czasopismo: International Journal of Electronics and Telecommunications
• Rocznik: 2013
• Tom: Vol. 59, No. 2
• Strony: 161--167
• Opis fizyczny: Bibliogr. 11 poz., wykr.

Twórcy

autor

Mueller J. H.

• Integrated Analog Circuits and RF Systems Laboratory, RWTH Aachen University, Aachen, Germany

autor

Strache S.

• Integrated Analog Circuits and RF Systems Laboratory, RWTH Aachen University, Aachen, Germany

autor

Busch L.

• Integrated Analog Circuits and RF Systems Laboratory, RWTH Aachen University, Aachen, Germany

autor

Wunderlich R.

• Integrated Analog Circuits and RF Systems Laboratory, RWTH Aachen University, Aachen, Germany

autor

Heinen S.

• Integrated Analog Circuits and RF Systems Laboratory, RWTH Aachen University, Aachen, Germany

Bibliografia

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