TiO₂ waveguides thin films prepared by sol-gel method on glass substrates with and without ZnO underlayer

• Autorzy: Bouachiba Y. , Taabouche A. , Bouabellou A. , Hanini F. , Sedrati C. , Merabti H.

Identyfikatory

DOI

10.2478/msp-2020-0043

• Języki publikacji: EN

Abstrakty

EN

TiO₂ thin films have been deposited on glass substrates with and without ZnO underlayer by sol-gel dip coating process. XRD patterns show the formation of anatase phase with the diffraction lines (1 0 1) and (2 0 0) in TiO₂ /glass sample. In TiO₂ /(ZnO/glass) sample, TiO₂ is composed of anatase phase with the diffraction line (2 0 0) but the diffraction peaks of ZnO wurtzite are also well-defined. The determination of the refractive index and the thickness of the waveguiding layers has been performed by m-lines spectroscopy. The thickness of TiO₂ thin films deduced by Rutheford Backscattering Geometry (RBS) agrees well with that obtained by m-lines spectroscopy. TiO₂ /glass sample exhibits one guided TE₀ and TM₀ polarized modes. In TiO₂ /(ZnO/glass) sample, only, TE0 single mode has been excited due to cutoff condition.

Słowa kluczowe

EN

TiO2; anatase; sol-gel; waveguides; ZnO/glass

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2020
• Tom: Vol. 38, No. 3
• Strony: 381--385
• Opis fizyczny: Bibliogr. 23 poz., rys., tab.

Twórcy

autor

Bouachiba Y.

• Department of Materials Science Engineering, National Polytechnic School of Constantine, Nouvelle Ville Universitaire Ali Mendjeli, Algeria
• Thin Films and Interfaces Laboratory, University of Mentouri Brothers, 25000 Constantine, Algeria

autor

Taabouche A.

• Thin Films and Interfaces Laboratory, University of Mentouri Brothers, 25000 Constantine, Algeria
• Faculty of Hydrocarbons and Renewable Energies and Earth and Universe Sciences, University Kasdi Merbah, 30000 Ouargla, Algeria

autor

Bouabellou A.

• Thin Films and Interfaces Laboratory, University of Mentouri Brothers, 25000 Constantine, Algeria

autor

Hanini F.

• Department of Materials Science, Faculty of Exact Sciences and Natural Sciences and Life, University of Laarbi Tebessi, Tebessa 12000, Algeria

autor

Sedrati C.

• Department of Materials Science Engineering, National Polytechnic School of Constantine, Nouvelle Ville Universitaire Ali Mendjeli, Algeria
• Thin Films and Interfaces Laboratory, University of Mentouri Brothers, 25000 Constantine, Algeria

autor

Merabti H.

• Research Center in Industrial Technologies CRTI, ex CSC, B.P. 64, Cheraga, Algiers, Algeria

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