Identyfikatory
Warianty tytułu
Języki publikacji
Abstrakty
The aim of the research was to investigate the influence of strontium on the structure of thin films La1-xSrxFeO3 (x = 0; 0,1; 0,2). The LaFeO3 and Sr-doped LaFeO3 films were produced by pulsed laser deposition (PLD) on Si (100) substrate using the Nd-YAG (λ = 266 nm) laser. SEM, AFM and XRD methods were used to characterize the structure and morphology of the thin films. X-Ray Diffraction analysis showed only the LaFeO3 phase in the undoped thin film and the La0.9Sr0.1O3 and La0.8Sr0.2O3 phases in thin films doped by Sr. The mean crystallite size, calculated by Williamson-Hall method, was smaller (of the order of 18 nm) in films doped by Sr. SEM analysis showed small droplets in thin films doped by Sr. Highly developed surface layer was observed using the AFM microscope for thin films doped by Sr.
Słowa kluczowe
Wydawca
Czasopismo
Rocznik
Tom
Strony
1063--1067
Opis fizyczny
Bibliogr. 23 poz., rys., tab., wykr., wzory
Twórcy
autor
- AGH-University of Science and Technology, Al. A. Mickiewicza 30, 30-059 Krakow, Poland
autor
- AGH-University of Science and Technology, Al. A. Mickiewicza 30, 30-059 Krakow, Poland
autor
- AGH-University of Science and Technology, Al. A. Mickiewicza 30, 30-059 Krakow, Poland
Bibliografia
- [1] J. W. Fergus, Sensors and Actuators B. 123, 1169 (2007).
- [2] X. Liu, H. Ji, Y. Gu, M. Xu, Mat. Scien. and Eng. B 133, 98 (2006).
- [3] S. Furfori, N. Russo, D. Fino, G. Saracco, V. Specchia, Chem. Eng. Scien. 65, 120 (2010).
- [4] F. Patel, S. Patel, Proc. Engin. 51, 324 (2013).
- [5] H. Takamura, Membrane Reactors for Energy Applications and Basic Chemical Production, 519-54 (2015).
- [6] K. Zhao, F. He, Z. Huang, A. Zheng, H. Li, Z. Zhao, Inter. J. of Hydr. Ener. 39, 3243 (2014).
- [7] O. Gwon, S. Yoo, J. Shin, G. Kim, Inter. J. of Hydr. Ener. 39, 20806 (2014).
- [8] X. Ding, W. Zhu, G. Hua, J. Li, Z. Wu, Electr. Acta 163, 204 (2015).
- [9] H. Li, S. Yin, Y. Wang, T. Sekino, S. W. Lee, T. Sato, J. of Cat. 297, 65 (2013).
- [10] S. Feraru, A. I. Borhan, P. Samoila, C. Mita, S. Cucu-Man, A. R. Iordan, M. N. Palamaru, J. Phot. and Phot. A, Chem. 307-308, 1 (2015).
- [11] P. A. Murade, V. S. Sangawar, G. N. Chaudhari, V. D. Kapse, A. U. Bajpeyee, Curr. Appl. Phys. 11, 451 (2011).
- [12] S. Thirumalairajan, K. Girija, V.R. Mastelaro, N. Ponpandian, Appl. Mater. Interf. 6(16), 13917 (2014).
- [13] Ch. W. Lee, R. K. Behera, S. Okamoto, R. Devanathan, E. D. Wachsman, S. R. Phillpot, S. B. Sinnott, J. Am. Ceram. Soc. 94, 1931 (2011).
- [14] S. Thirumalairajan, K. Girija, V. Ganesh, D. Mangalaraj, C. Viswanathan, N. Ponpandian, Cryst. Growth Des. 13, 291 (2013).
- [15] P. Song, H. Qin, L. Zhang, K. An, Zh. Lin, J. Hu, M. Jiang, Sens. and Actuat. B 104, 312 (2005).
- [16] Y. M. Zhang, Y. T. Lin, J. L. Chen, J. Zhang, Z. Q. Zhu, Q. J. Liu, Sens. and Actuat. B. Chemical 190, 171 (2014).
- [17] J. W. Seo, E. E. Fullerton, F. Nolting, A. Scholl, J. Fompeyrine, J. P. Locquet, J. Phys.: Condens. Matter 20, 264014 (2008).
- [18] M. Nistor, N. B. Mandache1, J. Perri`ere, J. Phys. D: Appl. Phys. 41, 165205 (2008).
- [19] R. Henda, G. Wilson, J. G. Munro, O. Alshekhli, A. M. McDonald, Thin Solid Films 520, 1885 (2012).
- [20] S. M. Selbach, J. R. Tolchard, A. Fossdal, T. Grande, Journal of Solid State Chemistry 196, 249 (2012).
- [21] S. Phokha, S. Hunpratup, S. Pinitsoontorn, B. Putasaeng, S. Rujirawat, S. Maensiri, Materials Research Bulletin 67, 118 (2015).
- [22] G. Pecchi, M. G. Jiliberto, A. Buljan, E. J. Delgado, Solid State Ionics 187, 27 (2011).
- [23] A. Kopia, L. Cieniek, K. Kowalski, J. Kusinski, Solid State Phenomena 231, 19(2015).
Uwagi
EN
This work was financially supported by the National Science Center through project number: UMO-2013/09/B/ST8/01681
PL
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-f4bfa504-21af-4787-8ad7-ca86344b7724