The Optimization Problem in Spectroscopic Ellipsometry Technique : Optical Spectra Determination for Pb5Ge3O11 Crystal

• Autorzy: Dorywalski K. , Krzyżyński T.
• Języki publikacji: EN

Abstrakty

EN

Ellipsometric spectra Ψ(λ), ∆(λ) was measured for Pb₅Ge₃O₁₁ optical crystal in the spectral range 388-620 nm. Mathematical model was developed taking into account optical anisotropy and surface roughness of the measured specimen. Nonlinear regression method was applied in order to fit experimental and modeled data. Refractive index spectra no(λ) ne(λ) are determined for Pb₅Ge₃O₁₁ single crystal for ordinary and extraordinary light beams. Ellipsometric spectra Ψ(λ), ∆(λ) was measured for Pb₅Ge₃O₁₁ optical crystal in the spectral range 388-620 nm. Mathematical model was developed taking into account optical anisotropy and surface roughness of the measured specimen. Nonlinear regression method was applied in order to fit experimental and modeled data. Refractive index spectra no(λ) ne(λ) are determined for Pb₅Ge₃O₁₁ single crystal for ordinary and extraordinary light beams.

Słowa kluczowe

EN

ellipsometry; optimization; lead germanate; optical constants

• Wydawca: Oficyna Wydawnicza Politechniki Warszawskiej
• Czasopismo: Machine Dynamics Research
• Rocznik: 2015
• Tom: Vol. 39, No. 4
• Strony: 21--30
• Opis fizyczny: Bibliogr. 13 poz., tab., wykr.

Twórcy

autor

Dorywalski K.

• Koszalin University of Technology, Department of Mechatronics and Applied Mechanics, Faculty of Technology and Education

autor

Krzyżyński T.

• Koszalin University of Technology, Department of Mechatronics and Applied Mechanics, Faculty of Technology and Education

Bibliografia

• 1. Azzam, R.M.A. and Bashara, N.B. (1987). Ellipsometry and Polarized Light. North-Holland Personal Library, New York.
• 2. Cobet, C. (2005). Linear optical properties of III-nitride semiconductors between 3 and 30 eV. PhD thesis, Berlin. doctoral thesis.
• 3. Fujiwara, H. (2007). Spectroscopic Ellipsometry, Principles and Applications. John Wiley & Sons Ltd.
• 4. Garcia-Caurel, Enric and De Martino, Antonello and Gaston, Jean-Paul and Yan, Li (2013). Application of spectroscopic ellipsometry and Mueller ellipsometry to optical characterization. Applied Spectroscopy, 67(1):1–21.
• 5. Iwasaki, H. and Miyazawa, S. and Koizumi, H. and Sugii, K. and Niizeki, N. (1972). Ferroelectric and optical properties of Pb5ge3O11 and its isomorphous compound Pb5Ge2SiO11. J. Appl. Phys, 43(4907).
• 6. Jellison, J.G.E. (1991). Use of biased estimator in the interpretation of spectroscopic ellipsometry data. Appl. Opt., 30:3354–3360.
• 7. Li, T. and Hsu, S.T. (2001). Ferroelectric Pb5Ge3O11 MFMOS capacitor for one transistor memory applications. Integr. Ferroelectr., 34:55–63.
• 8. Mendricks, S. and Yue, X. and Pankrath, R. and Hesse, H. and Kip, D. (1999). Dynamic properties of multiple grating formation in doped and thermally treated lead germanate. Appl. Phys. B, 68:877–885.
• 9. Press, W.H. and Teukolsky, S.A. and Vetterling, W.T. and Flannery, B.P. (2002). Numerical Recipes in C++: The Art of Scientific Computing. Cambridge University Press, Cambridge.
• 10. Reyher, H.J. and Pape, M. and Hausfeld, N. (2001). Photoactive Pb3+ host lattice ions in photorefractive Pb5Ge3O11 investigated by magnetic resonance techniques. Journal of Physics: Condensed Matter, 13(16):3767–3778.
• 11. Röseler, A. (1990). Infrared spectroscopic ellipsometry. Akademie-Verlag, Berlin.
• 12. Simon, M. and Mersch, F. and Kuper, C. and Mendricks, S. and Wevering, S. and Imbrock, J. and Kratzig, E. (1997). Refractive indices of photorefractive BIT, BCT, BGO, and PGO. Phys. Stat. Sol. (a), 159:559–562.
• 13. Tompkins, H.G. (1993). A User’s Guide to Ellipsometry. Academic Press, San Diego.

Uwagi

PL

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę.