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Tytuł artykułu

Effect of Co Doping on Structural and Optical Properties of NiO Thin Films Prepared By Chemical Spray Pyrolysis Method

Treść / Zawartość
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
In this work, nickel-cobalt oxide (Ni(1-x)CoxO) thin films, where x = 0, 4, 6 and 8 % have been successfully deposited on glass substrates by chemical spray pyrolysis (CSP) technique at substrate temperature of (400 °C) and thickness of about 300 nm. The structural and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy. The XRD results showed that all films are polycrystalline in nature with cubic structure and preferred orientation along (111) plane. The crystallite size was calculated using Scherrer formula and it is found that the undoped NiO sample has maximum crystallite size (51.16 nm). AFM results showed homogenous and smooth thin films. The absorbance and transmittance spectra have been recorded in the wavelength range of (300-900) nm in order to study the optical properties. The optical energy gap for allowed direct electronic transition was calculated using Tauc equation. It is found that the band gap decreases as the Co-concentration increases and the band gap values were in the range of 3.58-3.66 eV and 3.58 eV for the prepared Nickel-Cobalt Oxide thin films. The Urbach energy increases as the Co-concentration increases and the Urbach. The optical constants including (absorption coefficient, real and imaginary parts of dielectric constant) were also calculated as a function of photon energy. Refractive index and extinction coefficient for Nickel- Cobalt Oxide thin films were estimated as a function of wavelength.
Rocznik
Tom
Strony
15--30
Opis fizyczny
Bibliogr. 18 poz., rys., tab.
Twórcy
autor
  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq
autor
  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq
autor
  • Department of Physics, College of Science, University of Diyala, Diyala, Iraq
Bibliografia
  • [1] P. Pradniak, "Handbook of Inorganic Chemicals", McGraw-Hill Publications, 2002.
  • [2] N. Greenwood, A. Earnshaw, "Chemistry of the Elements". Oxford, Pergamon Press. 1984.
  • [3] K. Lascelles, L. G. Morgan, D. Nicholls, D. Beyersmann, "Nickel Compounds", in Ullmann's Encyclopedia of Industrial Chemistry, Wiley-VCH, Weinheim, 2005.
  • [4] E. Fujii, A. Tomozawa, H. Torii, R. Takayama, Jpn. J. Appl. Phys. 35 (1996) 328-330.
  • [5] H. Sato, T. Minami, S. Takata, T. Yamada, Thin Solid Films 236 (1993) 27-31.
  • [6] R. Cerc Korosec, P. Bukovec, B. Pihlar, A. Surca Vuk, B. Orel, G. Drazic, Solid State Ionics, 165 (2003).
  • [7] M. Caglar, S. Ilcan, Y. Caglar, Trakya Univ. J. Sci. 7(2) (2006) 153.
  • [8] A. F. Saleh, International Journal of Application or Innovation in Engineering & Management 2(1) (2013) 16.
  • [9] C. Barret, Massalki T. B. , " Structure of Metals ", Oxford Pergamon, (1980).
  • [10] A.R. Balu, V.S. Nagarethinam, N. Arunkumar, M. Suganya, Journal of Electron Devices 13 (2012) 920-930.
  • [11] R. A. Ismail, S. Ghafori, G. A. Kadhim, Appl. Nanosci. 3 (2013) 509-514.
  • [12] V. D. Mote, Y. Purushotham, B. N. Dole, Journal of Theoretical and Applied Physics 6(6) (2012).
  • [13] C. Barret, T. B. Massalki, "Structure of Metals", Oxford Pergamon, 1980.
  • [14] B. Sahin, F. Bayansala, M.Yukselc, N. Biyiklib, J. Ceramics International 40 (2014) 5237-5243.
  • [15] J. I. Pankove, "Optical Process in Semiconductors", Dover Publishing, Inc., New York, 1971.
  • [16] C. F. K. Lingshirn, "Semiconductor Optics", Springer Verlag, Berlin Hridelberg, (1st ed.), 1997.
  • [17] Nibras F. Al.Shammary, Journal of Kufa-Physics 2(1) (2010).
  • [18] S. S. Ahmed, E. K. Hassan, G. H. Mohamed, International Journal of Advanced Research 2(2) (2014) 633-638.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-eb49443e-e7b9-4f98-9979-e08034d308ab
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