Reliability wave in light of the nano development

• Autorzy: Way K.
• Języki publikacji: EN

Abstrakty

EN

This talk is based on the Editorial of IEEE Transactions on Reliability, December, 2006 and discusses a framework for applying reliability principles and practices to the emerging nano technology fields.

Słowa kluczowe

EN

stress test; nanotechnology

• Wydawca: Polskie Towarzystwo Bezpieczeństwa i Niezawodności
• Czasopismo: Journal of Polish Safety and Reliability Association
• Rocznik: 2007
• Tom: Vol. 2
• Strony: 251--253
• Opis fizyczny: Bibliogr. 6 poz.

Twórcy

autor

Way K.

• The University of Tennessee, Knoxville, TN, USA

Bibliografia

• [1] The National Academies Keck Futures Initiative Nanoscience and Nanotechnology Steering Committee. (2004). Designing Nanostructures at the Interface between Biomedical and Physical Systems. National Academies Press, 106 pp., Washington, DC.
• [2] The National Academies Press. (2002). Implications of Emerging Micro- and Nanotechnologies, 251 pp., Washington, DC.
• [3] Yue Kuo. (2006). Thin Film Nano & Microelectronics Research Lab. Texas A&M University.
• [4] Way Kuo & Kim, T. (1999). An Overview of Manufacturing Yield and Reliability Modeling for Semiconductor Products. Proceedings of the IEEE, 87(8), 1329-1346.
• [5] Way Kuo & Prasad, V. R. (2000). An Annotated Overview of System Reliability Optimization. IEEE Transactions on Reliability, 49(2), 176-187.
• [6] Way Kuo, Velaga, R., Tillman, F. A. & Hwang, C. L. (2001). Optimal Reliability Design: Fundamentals and Applications, 411 pp., Cambridge University Press, U.K.