Contactless method for resistance measurement of ultra-thin printed and conductive lines

• Autorzy: Szybiński Krzysztof

Identyfikatory

DOI

10.24425/mms.2020.134592

• Języki publikacji: EN

Abstrakty

EN

In this paper the problem of resistance measurement of ultrathin conductive lines on dielectric substrates dedicated for printing electronic industry is discussed. The measured line is transformed in a non-invasive way into a resonance circuit. By using a magnetic coupling between the source line and the tested line, the resistance measurement can be performed non-invasively, i.e. without a mechanical contact. The proposed contactless resistance measurement method is based on the resonance quality factor estimation and it is an example of the inverse problem in metrology.

Słowa kluczowe

EN

inkjet printing electronics; resistance measurements; micrometer conducting lines; contactless method; resonance circuits

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2020
• Tom: Vol. 27, nr 3
• Strony: 427--439
• Opis fizyczny: Bibliogr. 24 poz., rys., wykr., wzory

Twórcy

autor

Szybiński Krzysztof

• Wrocław University of Science and Technology, Chair of Electronic and Photonic Metrology, ul. B. Prusa 53/55, 50-317 Wrocław, Poland

Bibliografia

• [1] Jiazhen S., Jiang J., Bao B., Wang S., He M., Zhang X. Song Y. (2016). Fabrication of Bendable Circuits on a Polydimethylsiloxane (PDMS) Surface by Inkjet Printing Semi-Wrapped Structures. Materials, 9(4), 253.
• [2] FormFactor (2018). Cascade MPS150 150mm Manual Probe Station. [Datasheet]. https://www.formfactor.com/download/mps150-data-sheet/?wpdmdl=3221&refresh=5df8036de34ba1576534893 (accessed on Aug. 2020).
• [3] Chen, S.P., Chiu, H.L., Wang, P.H., Liao, Y.C., (2015). Inkjet Printed Conductive Tracks for Printed Electronics. ECS Journal of Solid State Science and Technology, 4(4), 3026-3033.
• [4] Souk J., Morozumi S., Luo F.C., Bita I., (eds.). (2018). Flat Panel Display Manufacturing. John Wiley & Sons.
• [5] Yin, Z., Huang, Y., Bu, N., Wang, X., Xiong, Y. (2010). Inkjet printing for flexible electronics: Materials, processes and equipments. Chinese Science Bulletin, 55(30), 3383-3407.
• [6] Murty, Y.V. (2001). Electrical and electronic connectors: materials and technology. In Buschow, K.H.J., Cahn, R.W., Flemings, M.C., Ilschner, B., Kramer, E.J. Encyclopedia of Materials: Science and Technology. 2483-2494. Elsevier.
• [7] Fernandez-Pacheco, A. (2011). Studies of Nanoconstrictions, Nanowires and Fe3O4 Thin Films Electrical Conduction and Magnetic Properties. Fabrication by Focused Electron/Ion Beam. Berlin Heidelberg: Springer Verlag.
• [8] Neff, C. (2018). Analysis of Printed Electronic Adhesion, Electrical, Mechanical, and Thermal Performance for Resilient Hybrid Electronics. [Doctoral Dissertation, University of South Florida]. https://scholarcommons.usf.edu/etd/7551/ (accessed on Aug. 2020).
• [9] Mroczka, J. (2013). The cognitive process in metrology. Measurement, 46(8), 2896-2907.
• [10] Kamyshny, A., Magdassi, S. (2017). Nanomaterials for 2D and 3D Printing. Weinheim: Wiley-VCH.
• [11] Kang, J.S., Ryu, J., Kim, H.S., Hahn, H.T. (2011). Sintering of inkjet-printed silver nanoparticles at room temperature using intense pulsed light. Journal of Electronic Materials, 40, 2268.
• [12] Kim, D., Jeong, S., Moon, J., Kang, K. (2006). Ink-jet printing of silver conductive tracks on flexible substrates. Molecular Crystals and Liquid Crystals, 459(1), 45-55.
• [13] Caniggia, S., Maradei, S. (2008). Signal Integrity and Radiated Emission of High-Speed Digital Systems, Appendix A: Formulae for Partial Inductance Calculation. 481-486. Singapore: John Wiley& Sons, Ltd.
• [14] Aeffner, F., Hibret, A.A., Boyle, M.C, Cardiff, R.D., Hagendorn, E., Hoenerhoff, M.J., Klopfleisch, R., Newbigging, S., Schaudien, D., Turner, O., Wilson, K. (2018). Digital Microscopy, Image Analysis, and Virtual Slide Repository. ILAR Journal, 59(1), 66-79.
• [15] Vernon-Parry, K.D. (2000). Scanning electron microscopy: an introduction. III-Vs Review, 13(4), 40-44.
• [16] Grouvers, F.W. (1946). Inductance calculations. New York: Van Nostrand.
• [17] Khoo S.W., Saravanan K., Tan C.S. (2016). A Review of Surface Deformation and Strain Measurement Using Two-Dimensional Digital Image Correlation. Metrology and Measurement Systems, 23(3), 461-480.
• [18] Krupka J., Kamiński P., Kozłowski R., Surma B., Dierlamm A., Kwestarz M. (2015). Dielectric properties of semi-insulating silicon at microwave frequencies. Applied Physics Letters, 107(8), 082105.
• [19] Li, Y.G., Lu, D., Wong, C.P. (2009). Conductive Nano-Inks. In Electrical conductive adhesives with nanotechnologies. 303-360. Springer Science & Business Media.
• [20] Borkowski, J. (2012). Systematic errors of the LIDFT method: Analytical form and verification by a Monte Carlo method. Metrology and Measurement Systems, 19(4), 673-684.
• [21] Borkowski, J., Matuszewski, B.J., Mroczka, J., Shark, L.K. (2002). Geometric matching of circular features by least squares fitting. Pattern Recognition Letters, 23(7), 885-894.
• [22] Keithley. 2100 Series: 6½-Digit USB Multimeter. [Datasheet]. https://www.tek.com/tektronix-and-keithley-digital-multimeter/keithley-2100-series-6%C2%BD-digit-usb-multimeter (accessed on Aug. 2020).
• [23] Geyer, R.G. (1990). Dielectric Characterization and Reference Materials. National Institute of Standards and Technology, Technical Note 1338. U.S. Government Printing Office, Washington.
• [24] Kwiatkowski, P., Różyc, K., Sawicki, M., Jachna, Z., Szplet, R. (2017). 5 ps jitter programmable time interval/frequency generator. Metrology and Measurement Systems, 24(1), 57-68.

Uwagi

PL

Opracowanie rekordu ze środków MNiSW, umowa Nr 461252 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2020).