An Orientation-space Super Sampling Technique for Six-dimensional Diffraction Contrast Tomography

• Autorzy: Viganò N. , Batenburg K. J. , Ludwig W.

Identyfikatory

DOI

10.3233/FI-2016-1383

• Języki publikacji: EN

Abstrakty

EN

Diffraction contrast tomography (DCT) is an X-ray full-field imaging technique that allows for the non-destructive three-dimensional investigation of polycrystalline materials and the determination of the physical and morphological properties of their crystallographic domains, called grains. This task is considered more and more challenging with the increasing intra-granular deformation, also known as orientation-spread. The recent introduction of a sixdimensional reconstruction framework in DCT (6D-DCT) has proven to be able to address the intra-granular crystal orientation for moderately deformed materials. The approach used in 6D-DCT, which is an extended sampling of the six-dimensional combined position-orientation space, has a linear scaling between the number of sampled orientations, which determine the orientation-space resolution of the problem, and computer memory usage. As a result, the reconstruction of more deformed materials is limited by their high resource requirements from a memory and computational point of view, which can easily become too demanding for the currently available computer technologies. In this article we propose a super-sampling method for the orientation-space representation of the six-dimensional DCT framework that enables the reconstruction of more deformed cases by reducing the impact on system memory, at the expense of longer reconstruction times. The use of super-sampling can further improve the quality and accuracy of the reconstructions, especially in cases where memory restrictions force us to adapt to inadequate (undersampled) orientation-space sampling.

Słowa kluczowe

EN

orientation; tomography; x-ray imaging; polycrystals; computer storage devices; sampling

• Wydawca: IOS Press
• Czasopismo: Fundamenta Informaticae
• Rocznik: 2016
• Tom: Vol. 146, nr 2
• Strony: 219--230
• Opis fizyczny: Bibliogr. 12 poz., rys.

Twórcy

autor

Viganò N.

• MATEIS, INSA Lyon, CNRS (UMR5510), Univ. Lyon, F-69621 Lyon, France
• ESRF, The European Synchrotron, F-38043 Grenoble, France

autor

Batenburg K. J.

• CWI, Amsterdam, 1098 XG Amsterdam, The Netherlands
• University of Leiden, Mathematical Institute, 2300 RA Leiden, The Netherlands

autor

Ludwig W.

• MATEIS, INSA Lyon, CNRS (UMR5510), Univ. Lyon, F-69621 Lyon, France
• ESRF, The European Synchrotron, F-38043 Grenoble, France

Bibliografia

• [1] Viganò N, Ludwig W, Batenburg KJ. Reconstruction of local orientation in grains using a discrete representation of orientation space. Journal of Applied Crystallography. 2014 oct;47(6):1826–1840. doi:10.1107/S1600576714020147.
• [2] Viganò N, Tanguy A, Hallais S, Dimanov A, Bornert M, Batenburg KJ, et al. Three-dimensional full-field X-ray orientation microscopy. Scientific Reports. 2016 feb;6. Available from: http://www.nature.com/articles/srep20618. doi:10.1038/srep20618.
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Uwagi

Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).