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A Novel Approach To Diagnosis Of Analog Circuit Incipient Faults Based On KECA And OAO LSSVM

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Treść / Zawartość
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Correct incipient identification of an analog circuit fault is conducive to the health of the analog circuit, yet very difficult. In this paper, a novel approach to analog circuit incipient fault identification is presented. Time responses are acquired by sampling outputs of the circuits under test, and then the responses are decomposed by the wavelet transform in order to generate energy features. Afterwards, lower-dimensional features are produced through the kernel entropy component analysis as samples for training and testing a one-against-one least squares support vector machine. Simulations of the incipient fault diagnosis for a Sallen-Key band-pass filter and a two-stage four-op-amp bi-quad low-pass filter demonstrate the diagnosing procedure of the proposed approach, and also reveal that the proposed approach has higher diagnosis accuracy than the referenced methods.
Rocznik
Strony
251--262
Opis fizyczny
Bibliogr. 28 poz., rys., tab., wykr., wzory
Twórcy
autor
  • Hefei University of Technology, School of Electrical Engineering and Automation, 230009 Hefei, China
  • Anqing Normal University, School of Physics and Electronic Engineering, 246011 Anqing, China
autor
  • Hefei University of Technology, School of Electrical Engineering and Automation, 230009 Hefei, China
autor
  • Hefei University of Technology, School of Electrical Engineering and Automation, 230009 Hefei, China
autor
  • Hefei University of Technology, School of Electrical Engineering and Automation, 230009 Hefei, China
autor
  • Hefei University of Technology, School of Electrical Engineering and Automation, 230009 Hefei, China
Bibliografia
  • [1] Pułka, A. (2011). Two heuristic algorithms for test point selection in analog circuit diagnoses. Metrol. Meas. Syst., 18(1), 115-128.
  • [2] Spina, R., Upadhyaya, S. (1997). Linear circuit fault diagnosis using neuromorphic analyzers. IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process., 44(3), 188-196.
  • [3] Aminian, F., Aminian, M. (2001). Fault diagnosis of analog circuits using Bayesian neural networks with wavelet transform as preprocessor. J. Electron. Test., 17(1), 29-36.
  • [4] Aminian, M., Aminian, F. (2007). A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor. IEEE Trans. Instrum. Meas., 56(5), 1546-1554.
  • [5] Xiao, Y., He, Y. (2010). A linear ridgelet network approach for fault diagnosis of analog circuit. Sci. China Inf. Sci., 53(11), 2251-2264.
  • [6] Aminian, M, Aminian, F. (2000). Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor. IEEE Trans. Circuits Syst. II, Analog Digit. Signal Process., 47(2), 151-156.
  • [7] Aminian, F., Aminian, M., Collins, H.W. (2002). Analog fault diagnosis of actual circuits using neural networks.IEEE Trans. Instrum. Meas., 51(3), 544-550.
  • [8] He, Y., Tan, Y., Sun, Y. (2004). Wavelet neural network approach for fault diagnosis of analogue circuits. Proc. Inst. Elect. Eng. - Circuits, Devices Syst., 151(4), 379-384.
  • [9] Long, B., Huang, J., Tian, S. (2008). Least squares support vector machine based analog-circuit fault diagnosis using wavelet transform as pre-processor. ICCCAS 2008., 1026-1029.
  • [10] Xiao, Y., He, Y. (2011). A novel approach for analog fault diagnosis based on neural networks and improved kernel PCA. Neurocomputing, 74(7), 1102-1115.
  • [11] Xu, L., Huang, J., Wang, H., Long, B. (2010). A novel method for the diagnosis of the incipient faults in analog circuits based on LDA and HMM. Circuits Syst. Signal Process., 29(4), 577-600.
  • [12] Xiao, Y., Feng, L. (2012). A novel neural-network approach of analog fault diagnosis based on kernel discriminant analysis and particle swarm optimization. Appl. Soft. Comput., 12(2), 904-920.
  • [13] Yuan, L., He, Y., Huang, J., Sun, Y. (2010). A new neural-network-based fault diagnosis approach for analog circuits by using kurtosis and entropy as a preprocessor. IEEE Trans. Instrum. Meas., 59(3), 586-595.
  • [14] Toczek, W., Kowalewski, M. (2005). A neural network based system for soft fault diagnosis in electronic circuits. Metrol. Meas. Syst., 12(4), 463-476.
  • [15] Grzechca, D. (2011). Soft fault clustering in analog electronic circuits with the use of self organizing neural network. Metrol. Meas. Syst., 18(4), 555-568.
  • [16] Tan, Y., He, Y., Cui, C., Qiu, G. (2008). A novel method for analog fault diagnosis based on neural networks and genetic algorithms. IEEE Trans. Instrum. Meas., 57(11), 2631-2639.
  • [17] Cortes, C., Vapnik, V. (1995). Support-vector networks. Mach Learn., 20(3), 273-297.
  • [18] Grzechca, D., Rutkowski, J. (2009). Fault diagnosis in analog electronic circuits-the SVM approach. Metrol. Meas. Syst., 16(4), 583-598.
  • [19] Cui, J., Wang, Y. (2010). A novel approach of analog fault classification using a support vector machines classifier. Metrol. Meas. Syst., 17(4), 561-581.
  • [20] Suykens, J.A.K., Vandewalle, J. (1999). Least squares support vector machine classifiers. Neural Process Lett., 9(3), 293-300.
  • [21] Vasan, A.S.S., Long, B., Pecht, M. (2013). Diagnostics and prognostics method for analog electronic circuits. IEEE TInd Electron., 60(11), 5277-5291.
  • [22] Cui, J., Wang, Y. (2011). Analog circuit fault classification using improved one-against-one Support Vector Machines. Metrol. Meas. Syst., 18(4), 569-582.
  • [23] Long, B., Tian, S., Wang, H. (2012). Feature vector selection method using Mahalanobis distance for diagnostics of analog circuits based on LS-SVM. J. Electron. Test., 28(5), 745-755.
  • [24] Jenssen, R. (2010). Kernel entropy component analysis. IEEE T. Pattern. Anal., 32(5), 847-860.
  • [25] Arizmendi, C., Vellido, A., Romero, E. (2012). Classification of human brain tumours from MRS data using Discrete Wavelet Transform and Bayesian Neural Networks. Expert Syst. Appl., 39(5), 5223-5232.
  • [26] Ni, J., Zhang, C., Yang, S.X. (2011).An adaptive approach based on KPCA and SVM for real-time fault diagnosis of HVCBs. IEEE T. Power Deliver., 26(3), 1960-1971.
  • [27] Shekar, B.H., Sharmila, K.M., Mestetskiy L.M., Dyshkantc, N.F. (2011). Face recognition using kernel entropy component analysis. Neurocomputing, 74(6), 1053-1057.
  • [28] Gomez-Chova, L., Jenssen, R., Camps-Valls, G. (2012). Kernel Entropy Component Analysis for Remote Sensing Image Clustering. IEEE Geosci Remote S., 9(2), 312-316.
Uwagi
EN
This work was supported by the National Natural Science Funds of China for Distinguished Young Scholar under Grant No. 50925727, the National Defense Advanced Research Project Grant No. C1120110004, 9140A27020211DZ5102, the Key Grant Project of Chinese Ministry of Education under Grant No. 313018, Anhui Provincial Science and Technology Foundation of China under Grant No. 1301022036, the Fundamental Research Funds for the Central Universities No. 2012HGCX0003, 2014HGCH0012 and National Natural Science Foundation of China No. 61401139, 61403115, 51407054.
Typ dokumentu
Bibliografia
Identyfikator YADDA
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