Precise sub-pixel size measurement with linear interpolation

• Autorzy: Yin A , Yang Z , Long G

Identyfikatory

DOI

10.5277/oa150111

• Języki publikacji: EN

Abstrakty

EN

High precision automated size measurements are required during industrial and scientific applications. The principle of sub-pixel measuring is based on an intensity interpolation algorithm. Combined with the characteristics of light, a system with high precision, short measuring time and low cost was developed. The proposed system is then applied to the measurement of 5 cm objects and compared with traditional measuring techniques. The experiment demonstrates that the measuring accuracy can reach up to 0.012 μm, and that the measurement size of the system is practical and prompt. In addition, it is able to meet the requirement for industrial applications in a variety of settings with stable performance and high precision.

Słowa kluczowe

EN

geometry size measurement; linear image sensor; linear interpolation algorithm

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2015
• Tom: Vol. 45, nr 1
• Strony: 113—123
• Opis fizyczny: Bibliogr. 15 poz., rys., tab.

Twórcy

autor

Yin A

• The State Key Laboratory of Mechanical Transmission, Chongqing 400044, China

autor

Yang Z

• School of Software Engineering, Chongqing University, Chongqing 401331, China
• [e-mail]

autor

Long G

• The State Key Laboratory of Mechanical Transmission, Chongqing 400044, China

Bibliografia

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