PL EN


Preferencje help
Widoczny [Schowaj] Abstrakt
Liczba wyników
Powiadomienia systemowe
  • Sesja wygasła!
  • Sesja wygasła!
Tytuł artykułu

Simultaneous measurement of refractive index and thickness for optically transparent object with a dual-wavelength quantitative technique

Autorzy
Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
We present a new dual-wavelength quantitative measurement approach that can be employed for simultaneously measuring both the refractive index and the thickness of the homogenous specimen. This method is realized by dual-wavelength in-line phase-shifting digital holography, and then the phase images are obtained by using four-phase step algorithm for each wavelength separately. Based on computer simulation technology, the feasibility and the effectiveness of our proposed method are demonstrated by comparing our simulation results with the experimental results of the spherical silica bead and the red blood cell, respectively. Our work will provide some guidance in the experimental research for transparent phase objects.
Czasopismo
Rocznik
Strony
597--605
Opis fizyczny
Bibliogr. 18 poz., rys.
Twórcy
autor
  • School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China
  • School of Mechanical Engineering, Yangzhou Polytechnic College, Yangzhou 225009, China
autor
  • School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China
  • Faculty of Science, Jiangsu University, Zhenjiang 212013, China
autor
  • School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China
autor
  • School of Mechanical Engineering, Jiangsu University, Zhenjiang 212013, China
Bibliografia
  • [1] GOODMAN J.W., LAWRENCE R.W., Digital image formation from electronically detected holograms, Applied Physics Letters 11(3), 1967, pp. 77–79.
  • [2] KÜHN J., COLOMB T., MONTFORT F., CHARRIÈRE F., EMERY Y., CUCHE E., MARQUET P., DEPEURSINGE C., Real-time dual-wavelngth digital holographic microscopy with a single hologram acquisition, Optics Express 15(12), 2007, pp. 7231–7242.
  • [3] GASS J., DAKOFF A., KIM M.K., Phase imaging without 2π ambiguity by multiwavelength digital holography, Optics Letters 28(13), 2003, pp. 1141–1143.
  • [4] PARSHALL D., KIM M.K., Digital holographic microscopy with dual-wavelength phase unwrapping, Applied Optics 45(3), 2006, pp. 451–459.
  • [5] KHMALADZE A., MYUNG KIM, CHUN-MIN LO, Phase imaging of cells by simultaneous dual-wavelength reflection digital holography, Optics Express 16(15), 2008, pp. 10900–10911.
  • [6] YEOU-YEN CHENG, WYANT J.C., Two-wavelength phase shifting interferometry, Applied Optics 23(24), 1984, pp. 4539–4543.
  • [7] WAGNER C., OSTEN W., SEEBACHER S., Direct shape measurement by digital wavefront reconstruction and multiwavelength contouring, Optical Engineering 39(1), 2000, pp. 79–85.
  • [8] ABDELSALAM D.G., MAGNUSSON R., DAESUK KIM, Single-shot, dual-wavelength digital holography based on polarizing separation, Applied Optics 50(19), 2011, pp. 3360–3368.
  • [9] ABDELSALAM D.G., DAESUK KIM, Two-wavelength in-line phase-shifting interferometry based on polarizing separation for accurate surface profiling, Applied Optics 50(33), 2011, pp. 6153–6161.
  • [10] KUMAR U.P., BASANTA BHADURI, KOTHIYAL M.P., KRISHNA MOHAN N., Two-wavelength micro-interferometry for 3-D surface profiling, Optics and Lasers in Engineering 47(2), 2009, pp. 223–229.
  • [11] BARADA D., KIIRE T., SUGISAKA J., KAWATA S., YATAGAI T., Simultaneous two-wavelength Doppler phase-shifting digital holography, Applied Optics 50(34), 2011, pp. H237–H244.
  • [12] RAPPAZ B., CHARRIÈRE F., DEPEURSINGE C., MAGISTRETTI P.J., MARQUET P., Simultaneous cell morphometry and refractive index measurement with dual-wavelength digital holographic microscopy and dye-enhanced dispersion of perfuson medium, Optics Letters 33(7), 2008, pp. 744–746.
  • [13] HEE JOO CHOI, HWAN HONG LIM, HAN SEB MOON, TAE BONG EOM, JUNG JIN JU, MYOUNGSIK CHA, Measurement of refractive index and thickness of transparent plate by dual-wavelength interference, Optics Express 18(9), 2010, pp. 9429–9434.
  • [14] JAFARFARD M.R., SUCBEI MOON, BEHNAM TAYEBEI, DUG YOUNG KIM, Dual-wavelength diffraction phase microscopy for simultaneous measurement of refractive index and thickness, Optics Letters 39(10), 2014, pp. 2908–2911
  • [15] NIYOM LUE, WONSHIK CHOI, POPESCU G., ZAHID YAQOOB, KAMRAN BADIZADEGAN, DASARI R.R., FELD M.S., Live cell refractometry using Hilbert phase microscopy and confocal reflectance microscopy, The Journal of Physical Chemistry A 113(47), 2009, pp. 13327–13330.
  • [16] POPESCU G., YOUNGKEUN PARK, WONSHIK CHOI, DASARI R.R., FELD M.S., BADIZADEGAN K., Imaging red blood cell dynamics by quantitative phase microscopy, Blood Cells, Molecules, and Diseases 41(1), 2008, pp. 10–16.
  • [17] RAPPAZ B., MARQUET P., CUCHE E., EMERY Y., DEPEURSINGE C., MAGISTRETTI P.J., Measurement of the integral refractive index and dynamic cell morphometry of living cells with digital holographic microscopy, Optics Express 13(23), 2005, pp. 9361–9373.
  • [18] MOSIÑO J.F., SERVIN M., ESTRADA J.C., QUIROGA J.A., Phasorial analysis of detuning error in temporal phase shifting algorithms, Optics Express 17(7), 2009, pp. 5618–5623.
Uwagi
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-d9070c23-1d45-4bd8-b1a3-8faf4708422d
JavaScript jest wyłączony w Twojej przeglądarce internetowej. Włącz go, a następnie odśwież stronę, aby móc w pełni z niej korzystać.