Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique

• Autorzy: Abd-Elnaiem A. M. , Mohamed M. , Hassan R. M. , Abdel-Rahim M. A. , Abu-Sehly A. A. , Hafiz M. M.

Identyfikatory

DOI

10.1515/msp-2018-0022

• Języki publikacji: EN

Abstrakty

EN

Effect of annealing temperature on the structural and optical properties of As₃₀Te₆₀Ga₁₀ thin film was studied using various techniques such as differential scanning calorimetry (DSC), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The DSC analysis revealed that the As₃₀Te₆₀Ga₁₀ glass has a single glass transition and crystallization peak while XRD results confirmed that the as-prepared and annealed films have crystalline nature. The coexistence of the crystalline phases in the investigated films could be attributed to the formation of orthorhombic As, hexagonal Ga₇Te₁₀, and monoclinic As₂Te₃ phases. It was found that the average crystallite size and optical parameters of the studied films depend on the annealing temperature. For example, the optical band gap decreased from 1.54 eV to 1.11 eV as the annealing temperature increased from 300 K to 433 K.

Słowa kluczowe

EN

chalcogenide; As-Te-Ga; thin films; structural properties; optical properties; thermal evaporation

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2018
• Tom: Vol. 36, No. 2
• Strony: 193--202
• Opis fizyczny: Bibliogr. 40 poz., rys., tab.

Twórcy

autor

Abd-Elnaiem A. M.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt

autor

Mohamed M.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt

autor

Hassan R. M.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt
• Physics Department, Faculty of Education-Zingiber, Aden University, Yemen

autor

Abdel-Rahim M. A.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt

autor

Abu-Sehly A. A.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt

autor

Hafiz M. M.

• Physics Department, Faculty of Science, Assiut University, 71516 Assiut, Egypt

Bibliografia

• [1] ZALLEN R., PENCHINA C.M., Am. J. Phys., 54 (1986), 862.
• [2] BURINA A., LECANTE P., MOSSET A., GALY J., TONNERRE J.M., RAOUX D., J. Non-Cryst. Solids, 212 (1997), 23.
• [3] ENDO H., HOSHINO H., IKEMOTO H., MIYANAGA T., J. Phys.-Condens. Mat., 12 (2000), 6077.
• [4] KASEMAN D.C., HUNG I., LEE K., KOVNIR K., GAN Z., AITKEN B., SEN S., J. Phys. Chem. B, 119 (2015), 2081.
• [5] SEDDON A.B., J. Non-Cryst. Solids, 184 (1995), 44.
• [6] ABD-ELNAIEM A.M., MOHAMED M., HASSAN R.M., ABDEL-RAHIM M.A., ABU-SEHLY A.A., HAFIZ M.M., Mater. Sci.-Poland, 35 (2017), 335.
• [7] DAVIS E.A., MOTT N.F., Philos. Mag., 22 (1970), 0903.
• [8] TVERJANOVICH A., YAGODKINA M., STRYKANOV V., J. Non-Cryst. Solids, 223 (1998), 86.
• [9] FAIGEL GY., GRANASY L., VINCZE I., WAARD DE H., J. Non-Cryst. Solids, 57 (1983), 411.
• [10] TOSCANI S., DUGUE J., CEOLIN R., Thermochim. Acta, 196 (1992), 191.
• [11] HAFIZ M.M., MOHARRAM A.H., ABU-SEHLY A.A., Appl. Surf. Sci., 115 (1997), 203.
• [12] MURUGAVEL S., ACHARYA K.V., ASOKAN S., J. Non- Cryst. Solids, 191 (1995), 327.
• [13] QUINN R.K., Mater. Res. Bull., 9 (1974), 803.
• [14] TITUS S.S.K., ASOKAN S., GOPAL E.S.R., Solid State Commun., 83 (1992), 745.
• [15] CORNET J., ROSSIER D., J. Non-Cryst. Solids, 12 (1973), 85.
• [16] CORNET J., ROSSIER D., J. Non-Cryst. Solids, 12 (1973), 61.
• [17] KIM S., KIM H., CHOI S., J. Alloy. Compd., 667 (2016), 91.
• [18] JOVARI P., LUCAS P., YANG Z., BUREAU B., KABAN I., BEUNEU B., PANATLEI C., BEDNARCIK J., J. Non-Cryst. Solids, 433 (2016), 1.
• [19] LUCAS P., COLEMAN G.J., KASEMAN D.C., YANG Z., HUNG I., GAN Z., SEN S., J. Non-Cryst. Solids, 432 (2016), 527.
• [20] TVERJANOVICH A., RODIONOV K., BYCHKOV E., J. Solid State Chem., 190 (2012), 271.
• [21] DONGOL M., HAFIZ M.M., ABOU-ZIED M., ELHADY A.F., Appl. Surf. Sci., 185 (2001), 1.
• [22] MANIKANDAN N., ASOKAN S., J. Non-Cryst. Solids, 353 (2007), 1247.
• [23] MOHAMED M., ABD-ELNAIEM A.M., HASSAN R.M., ABDEL-RAHIM M.A. HAFIZ M.M., Appl. Phys. A, 123 (2017), 511.
• [24] PATTERSON A.L., Phys. Rev., 56 (1939), 978.
• [25] ABDEL-RAHIM M.N., ABDEL-LATIF A.Y., SOLTAN A.S., Physica B, 291 (2000), 41.
• [26] ABU EL-FADL A., HAFIZ M.M., WAKAAD M.M., AASHOUR A.S., Radiat. Phys. Chem., 76 (2007), 61.
• [27] ABDEL-RAHIM M.A., J. Phys. Chem. Solids, 60 (1999), 29.
• [28] URBACH F., Phys. Rev., 92 (1953), 1324.
• [29] VINCENT R.K., HUNT G.R., Appl. Opt., 7 (1968), 53.
• [30] GRAVESTEIJN D.J., Appl. Opt., 27 (1988), 736.
• [31] WEMPLE S.H., Phys. Rev.B, 7 (1973), 3767.
• [32] KHAN Z.H., ZULFEQUAR M., SHARMA T.P., HUSAIN M., Opt. Mater., 6 (1996), 139.
• [33] LEE P.A., SAID G., DAVIS R., LIM T.H., J. Phys. Chem. Solids, 30 (1969), 2719.
• [34] KOSEK F., CIMPL Z., MIKHAILOV M.D., KARPOVA E.A., J. Non-Cryst. Solids, 86 (1986), 265.
• [35] SHARMILA B. H., ASOKAN S., Appl. Phys. A, 82 (2006), 345.
• [36] TU K.N., ROSENBERG R., Analytical techniques for thin films: treatise on materials science and technology, Elsevier, 2017.
• [37] MOHAMED M., MOUSTAFA S., ABD-ELNAIEM A.M., ABDEL-RAHIM M.A., J. Alloy. Compd., 647 (2015), 771.
• [38] EL-SEBAII A.A., KHAN S.A., AL-MARZOUKI F.M., FAIDAH A.S., AL-GHAMDI A.A., J. Lumin., 132 (2012), 2082.
• [39] CHAUDHURI S., BISWAS S.K., CHOUDHURY A., GOSWAMI K., J. Non-Cryst. Solids, 54 (1983), 179.
• [40] HASEGAWA S., KITAGAWA M., Solid State Commun., 27 (1978), 855.

Uwagi

Opracowanie rekordu w ramach umowy 509/P-DUN/2018 ze środków MNiSW przeznaczonych na działalność upowszechniającą naukę (2018).