MPS(3N) transparent memory test for Pattern Sensitive Fault detection

• Autorzy: Mrozek I. , Busłowska E. , Sokół B.
• Języki publikacji: EN

Abstrakty

EN

Conventional memory tests based on only one run have constant and low faults coverage especially for Pattern Sensitive Faults (PSF). To increase faults coverage the multiple run March test algorithms have been used. As have been shown earlier the key element of multiple run March test algorithms are memory backgrounds. Only in a case of optimal set of backgrounds the high fault coverage can be achieved. For such optimal backgrounds the analytical calculation of NPSFk fault coverage for 3 and 4 runs of MPS(3N) test in this paper is presented. All of the analytical calculations are confirmed and validated by adequate experiments.

Słowa kluczowe

EN

transparent memory tests; memory testing; pattern sensitive faults; march tests

• Wydawca: Komisja Informatyki Polskiej Akademii Nauk, Oddział w Gdańsku
• Czasopismo: Metody Informatyki Stosowanej
• Rocznik: 2008
• Tom: nr 4 (Tom 17)
• Strony: 129--138
• Opis fizyczny: Bibliogr. 11 poz., rys., tab.

Twórcy

autor

Mrozek I.

• Bialystok Technical University, Faculty of Computer Science

autor

Busłowska E.

• Bialystok Technical University, Faculty of Computer Science

autor

Sokół B.

• Bialystok Technical University, Faculty of Computer Science

Bibliografia

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