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Mutation Churn Model

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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Mutation testing is considered as one of the most effective quality improvement technique by assessing the strength of the actual test suite. If no test is able to kill a given mutant, this means that the tests are not strong enough and we need to write additional one that will be able to kill this mutant. However, mutation testing is very time consuming. In this paper we investigate if it is possible to reduce the scope of the mutation analysis by running it only on the new or changed part of the code. Using data from the real open-source projects we analyze if there is a relation between mutation scope reduction and effectiveness of the mutation analysis.
Słowa kluczowe
Rocznik
Tom
Strony
227--236
Opis fizyczny
Bibliogr. 8 poz., rys.
Twórcy
autor
  • Faculty of Mathematics and Computer Science Jagiellonian University ul. Łojasiewicza 6, 30-348 Kraków, Poland
autor
  • Faculty of Mathematics and Computer Science Jagiellonian University ul. Łojasiewicza 6, 30-348 Kraków, Poland
  • Faculty of Mathematics and Computer Science Jagiellonian University ul. Łojasiewicza 6, 30-348 Kraków, Poland
Bibliografia
  • [1] Millo R.A.D., Lipton R.J., Sayward F.G., Hints on test data selection: help for the practicing programmer. IEEE Computer, 1978, 11(4), pp. 34–41.
  • [2] Ammann P., Offutt J., Introduction to Software Testing. Cambridge University Press, Cambridge, UK, 2008.
  • [3] Zhang L., Marinov D., Khurshid S., Faster mutation testing inspired by test prioritization and reduction. In: ISSTA 2013 – Proceedings of the International Symposium on Software Testing and Analysis, 2013, pp. 235–245.
  • [4] Usaola M.P., Mateo P.R., Mutation testing cost reduction techniques: A survey. IEEE Software(, 2010, 27, pp. 80–86.
  • [5] Kim S., Clark J.A., McDermid J.A., Investigating the effectiveness of objectoriented testing strategies using the mutation method, software testing. Verification and Reliability, 2001, 11 (3), pp. 207–225.
  • [6] s. Ma Y., r. Kwon Y., Offutt J., Inter-class mutation operators for java. In: Proceedings of the 13th International Symposium on Software Reliability Engineering, IEEE, 2002, pp. 352–363.
  • [7] Papadakis M., Traon Y.L., Metallaxis-fl: mutation-based fault localization. Software Testing, Verification and Reliability, 2015 (25), pp. 605–628.
  • [8] PIT Mutation Testing. http://pitest.org/, Accessed: 2016-12-30.
Uwagi
PL
Opracowanie ze środków MNiSW w ramach umowy 812/P-DUN/2016 na działalność upowszechniającą naukę (zadania 2017).
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-d24f4d35-6479-4853-a78d-a61550a4c3c9
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