Structural, morphological, and optical properties of AgxO thin films deposited via obliquely angle deposition

• Autorzy: Soltane H. Ben , Akkari F. Chaffar , Gallas B. , Kanzari M.

Identyfikatory

DOI

10.2478/msp-2023-0002

• Języki publikacji: EN

Abstrakty

EN

This work reports on the optical, structural, and morphological properties of silver oxide thin films obtained by postoxidation of silver deposited previously by the thermal evaporation technique. The samples were deposited on glass substrates using the oblique angle deposition technique for different angles of incidence γ (γ=0°, 20°, 40°, 60°, 75°, and 85°). γ is defined as the angle between the particle flux and the normal to the substrate. The resulting thin films were annealed in the free air at two temperatures (300°C and 400°C). X-ray diffraction (XRD), scanning electron microscopy (SEM), and UV-visible-NIR spectrophotometer were performed to study the crystal structure, as well as the morphological and optical properties (transmittance and reflectance), of the Ag_xO samples. X-ray diffraction analysis revealed the presence of the Ag_xO phase for the silver films deposited at a high angle of incidence and for the annealing temperature 300°C. In contrast, the diffractograms of the silver films annealed at 400°C show an amorphous behavior. Optical results indicated that the direct band gap energy increases pursuant to increasing the angle of incidence γ. The absorption coefficients of AgxO thin films were found to be in the range of 10³–10⁵ cm⁻¹. Additionally, we determined the birefringence for the layers annealed at 400°C and found that the highest value of birefringence is obtained corresponding to the angle of incidence 60°. Morphological analysis indicated that the porosity increases with the angle of incidence and highlights the amorphous nature of the films, which is attributed to the columnar structure.

Słowa kluczowe

EN

obliquely angle deposition; silver oxide; nanocolumnar AgxO thin films; structural characterization; optical analysis; morphological properties

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2023
• Tom: Vol. 41, No. 1
• Strony: 27--41
• Opis fizyczny: Bibliogr. 47 poz., rys., tab.

Twórcy

autor

Soltane H. Ben

• Université Tunis El Manar, Ecole Nationale d’Ingénieurs de Tunis, Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, BP37, 1002 Le Belvédère, Tunis, Tunisia
• Ecole Nationale Supérieure d’Ingenieurs de Tunis, Université de Tunis, 5 Avenue Taha Hussein, 1008 Tunis, Tunisia

autor

Akkari F. Chaffar

• Université Tunis El Manar, Ecole Nationale d’Ingénieurs de Tunis, Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, BP37, 1002 Le Belvédère, Tunis, Tunisia

autor

Gallas B.

• Sorbonne Université, CNRS, Institut des Nanosciences de Paris – UMR 7588Campus Pierre et Marie Curie, Case 840, 04 place Jussieu 75005 Paris, France

autor

Kanzari M.

• Université Tunis El Manar, Ecole Nationale d’Ingénieurs de Tunis, Laboratoire de Photovoltaïque et Matériaux Semiconducteurs, BP37, 1002 Le Belvédère, Tunis, Tunisia
• Universite de Tunis, Institut Préparatoire aux Etudes d’Ingénieurs de Tunis-IPEIT, 2, Rue Jawaher Lel Nehru, 1089 Montfleury, Tunisia

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Uwagi

Opracowanie rekordu ze środków MEiN, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2022-2023).