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Cost-effective titania layers over 100 nm thick : effect of annealing on the structural, morphological, and optical properties

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Titania dioxide (TiO₂) layers were synthesized via the acid-catalysed sol-gel route using titania (IV) ethoxide, and then annealed at temperatures varying in the range of 150-700 °C. The research concerned the effect of annealing temperature on the structure of TiO₂ layers, their surface morphology, and their optical properties. Further, X-ray diffractometry, and Raman spectroscopy were used to determine the structure of TiO₂ layers. Scanning electron and atomic force microscopy were used to study the surface morphology of TiO₂ layers. Transmittance, reflectance, absorption edge, and optical homogeneity were investigated by UV-VIS spectrophotometry, while the refractive index and thicknesses of TiO₂ layers were measured using a monochromatic ellipsometer. Chromatic dispersion characteristics of the complex refractive index were determined using spectroscopic ellipsometry. Structural studies have shown that the TiO₂ layers annealed at temperatures up to 300 °C are amorphous, while those annealed at temperatures exceeding 300 °C are polycrystalline containing only anatase nanocrystals with sizes increasing from 6 to 20 nm with the increase of the annealing temperature. Investigations on the surface morphology of TiO₂ layers have shown that the surface roughness increases with the increase in annealing temperature. Spectrophotometric investigations have shown that TiO₂ layers are homogeneous and the width of the indirect optical band gap varies with annealing temperature from 3.53 eV to 3.73 eV.
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art. no. e147913
Opis fizyczny
Bibliogr. 57 poz., rys., wykr.
Twórcy
  • Department of Optoelectronics. Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
  • Department of Optoelectronics. Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
autor
  • Department of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
  • Department of Physics, Cracow University of Technology, ul. Podchorążych 1, 30-084 Kraków, Poland
  • Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
  • Faculty of Materials Science and Ceramics AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
  • Faculty of Materials Science and Ceramics AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
  • Faculty of Materials Science and Ceramics AGH University of Science and Technology, al. Mickiewicza 30, 30-059 Krakow, Poland
  • Department of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland
  • Department of Optoelectronics. Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
  • Department of Optoelectronics. Silesian University of Technology, ul. B. Krzywoustego 2, 44-100 Gliwice, Poland
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Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-cf026143-5910-4843-988c-1189841e5e73
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