Degree of paraxiality of a multi-Gaussian beam diffracted by a circular aperture

• Autorzy: Cheng Jinping , Xiao Yingying , Wu Hao , Ji Xiaoling , Wang Tao

Identyfikatory

DOI

10.37190/oa230409

• Języki publikacji: EN

Abstrakty

EN

The degree of paraxiality (DOP) of a diffracted multi-Gaussian beam is discussed. It is shown that the DOP of the multi-Gaussian beam will decrease as it is diffracted by a circular aperture, and the DOP of the diffracted multi-Gaussian beam is influenced by both the aperture radius and the characteristics of beam source. As an example, the dependence of the DOP on the aperture radius, the boundary characteristic, and the beam waist width is investigated.

Słowa kluczowe

EN

multi-Gaussian beam; diffraction; degree of paraxiality

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2023
• Tom: Vol. 53, nr 4
• Strony: 621--631
• Opis fizyczny: Bibliogr. 35 poz., rys.

Twórcy

autor

Cheng Jinping

• Department of Physics, Sichuan Normal University, Chengdu 610068, China

autor

Xiao Yingying

• Department of Physics, Sichuan Normal University, Chengdu 610068, China

autor

Wu Hao

• Department of Physics, Sichuan Normal University, Chengdu 610068, China

autor

Ji Xiaoling

• Department of Physics, Sichuan Normal University, Chengdu 610068, China

autor

Wang Tao

• Department of Physics, Sichuan Normal University, Chengdu 610068, China
• [e-mail]

Bibliografia

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Uwagi

Opracowanie rekordu ze środków MNiSW, umowa nr SONP/SP/546092/2022 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2024).