Measuring Impedances of DC-biased Inductors by Using Vector Network Analyzers

• Autorzy: Asmanis G. , Stepins D. , Asmanis A. , Ribickis L.

Identyfikatory

DOI

10.24425/ijet.2019.129788

• Języki publikacji: EN

Abstrakty

EN

This paper is devoted to a detailed experimentally based analysis of applicability of vector network analyzers for measuring impedance of surface mount inductors with and without DC bias. The measurements are made using custom-made bias tees and a test fixture with an ordinary vector network analyzer. The main attention in the analysis is focused on measurement accuracy of an impedance of surface mount inductors. Measurement results obtained with a vector network analyzer will also be compared to those obtained by using an impedance analyzer based on auto-balancing bridge method.

Słowa kluczowe

EN

vector network analyzer; impedance; inductor; measurements; accuracy; bias tee

• Wydawca: Polish Academy of Sciences, Committee of Electronics and Telecommunication
• Czasopismo: International Journal of Electronics and Telecommunications
• Rocznik: 2019
• Tom: Vol. 65, No. 3
• Strony: 375--380
• Opis fizyczny: Bibliogr. 11 poz., wykr., rys., fot.

Twórcy

autor

Asmanis G.

• Institute of Industrial Electronics, Riga Technical University, Riga, Latvia

autor

Stepins D.

• Institute of Radio Electronics, Riga Technical University, Riga, Latvia

autor

Asmanis A.

• Institute of Industrial Electronics, Riga Technical University, Riga, Latvia

autor

Ribickis L.

• Institute of Industrial Electronics, Riga Technical University, Riga, Latvia

Bibliografia

• [1] Testing Chokes and Transformers with High-Current DC Bias. https://www.voltech.com/Articles/104-160/2_The_Effect_of_DC_Bias_on_Inductance_Measurements
• [2] K. Okada and T. Sekino. Impedance Measurement Handbook. Agilent Technologies, 2006.
• [3] Ultra Low Impedance Measurements Using 2-Port Measurements. Agilent Application Note, 2004.
• [4] R. Dosoudil, „Determination of permeability from impedance measurement using vector network analyzer,” Journal of electrical engineering, vol. 63, No.7, pp. 97-101, Oct. 2012.
• [5] William B. Kuhn, Adam P. Boutz, "Measuring and reporting high quality factors of inductors using vector network analyzers," IEEE Transactions on Microwave Theory and Techniques, vol.58, No.4, pp. 1046-1055, Apr. 2010.
• [6] D. Stepins, G. Asmanis, A. Asmanis, “Measuring Capacitor Parameters Using Vector Network Analyzers,” Electronics, vol.18, no.1, pp.29-38, June 2014.
• [7] C.J. Žlebic, D.R. Kljajic, N.V. Blaž, L.D. Živanov, A.B. Menicanin, and M.S. Damnjanovic, “Influence of DC Bias on the Electrical Characteristics of SMD Inductors,” IEEE Transactions on Magnetics, vol.51, no.1, pp. 1-4, Jan. 2015.
• [8] Keysight Technologies E4990A Impedance Analyzer datasheet.
• [9] Keysight 16047E Test Fixture Operation and Service Manual.
• [10] De-embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer. Agilent application note 1364-1.
• [11] Vector Network Analyzer Family ZVR datasheet. Rohde and Schwarz.

Uwagi

This paper is partly based on a PhD thesis “Surface-Mount Component 3D Modelling in Frequency Range 150 kHz-100 MHz” defended by A. Asmanis in 2018 in the Riga Technical University.