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Thermal Characterization of High-Frequency Flyback Power Transformer

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
This paper presents preliminary thermographic measurements and a simple thermal analysis of power losses in high-frequency (H-F) transformers used in AC-DC power converters. The analysis is based on complex thermal impedance and time constant distribution. The main aim of this research was to consider quantitatively the contribution of different power losses in the H-F transformer, including fringing flux effect.
Wydawca
Rocznik
Strony
237--241
Opis fizyczny
Bibliogr. 10 poz., rys., wykr., wzory
Twórcy
  • Stadium Power Ltd, Norwich, United Kingdom
  • Institute of Electronics, Lodz University of Technology, 90-924 Łódź, Wólczańska 211/215 St.
autor
  • Institute of Electronics, Lodz University of Technology, 90-924 Łódź, Wólczańska 211/215 St.
autor
  • Stadium Power Ltd, Norwich, United Kingdom
Bibliografia
  • [1] Goodenough J. B.: Summary of Losses in Magnetic Materials. IEEE Transactions on Magnetics, Vol. 38, No. 5, September 2002.
  • [2] McLyman C. W. T.: Transformer and Inductor Design Handbook, Fourth Edition, pp 2.25-2.28.
  • [3] Ferroxcube Data Handbook.: Soft Ferrites and Accessories, p. 95, 2009.
  • [4] Dixon L. H.: Eddy Current Losses in Transformer Windings and Circuit Wiring. Texas Instruments Inc., 2003.
  • [5] Duerbaum T., Albach M.: Core Losses in Transformers with An Arbitrary Shape of the Magnetizing Current, EPE Roc., Vol. 1, p. 1.171-1.176, 1995.
  • [6] Dowell P. L.: Effects of Eddy Currents in Transformer Windings, Proceedings of the IEE, vol. 113, pp. 1387–1394, August 1966.
  • [7] Papastergiou K. D., Macpherson D. E.: Air-gap effects in inductive energy transfer, Power Electronics Specialists Conference, 2008. PESC 2008. IEEE, Rhodes, 15-19 June 2008, pp. 4092 –4097, ISSN: 0275-9306.
  • [8] Vermeersch B. and De Mey G.: Thermal impedance plots of micro-scaled devices, Microelectronics Reliability, vol. 46, pp. 174–177, Jan 2006.
  • [9] Szekely V.: Identification of rc networks by deconvolution: chances and limits, IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, vol. 45, pp. 244–258, Mar. 1998.
  • [10] Vermeersch B.: Thermal AC modelling, simulation and experimental analysis of microelectronic structures including nanoscale and high-speed effects. PhD thesis, Faculteit Ingenieurswetenschappen (TW) UGent, Gent, 2009.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-c307ea48-b93c-4f81-8f51-626eca450457
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