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Illumination for chatter mark detection using machine vision

Treść / Zawartość
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Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Authors of this research present a new method for image acquisition using special illumination for milled surfaces. The presented method uses special light and camera setup to reveal chatter marks on processed surfaces. After the acquisition the images are digitally processed using a method based on Continuous Wavelet Transform. A milling experiment has been preformed for validation of the methods. The biggest advantage of this method is that it doesn't have to be manually set like other image processing methods used in chatter detection.
Rocznik
Strony
38--46
Opis fizyczny
Bibliogr. 8 poz., tab., rys.
Twórcy
  • West Pomeranian University of Technology Szczecin, Szczecin, Poland
autor
  • West Pomeranian University of Technology Szczecin, Szczecin, Poland
  • West Pomeranian University of Technology Szczecin, Szczecin, Poland
Bibliografia
  • [1] KHALIFA O. O., DENSIBALI A., FARIS W., 2006, Image processing for chatter identification in machining processes, International Journal Advanced Manufacturing Technology, 31/5–6, 443–449.
  • [2] SZYDLOWSKI M., POWALKA B., MARCHELEK K., 2010, Digital image processing in surface quality inspection, Proceedings of the ASME, 10th Biennial Conference on Engineering Systems Design and Analysis ESDA2010, ESDA2010–25260.
  • [3] LEE B.Y., TARNG Y.S., 2001, Surface roughness inspection by computer vision in turning operations, International Journal of Machine Tools and Manufacture, 41/9, 1251–1263.
  • [4] SZYDLOWSKI M., POWALKA B., 2012, Chatter detection algorithm based on machine vision, International Advanced Manufacturing Technology, 62/5–8, 517–528.
  • [5] BAMBERGER H., RAMACHANDRAN S., HONG E., KATZ R., 2011, Identification of Machining chatter marks on surfaces of automotive valve seats, Journal of Manufacturing Science and Engineering, 133/4, 041003– 041003.
  • [6] DAUBECHIES I., 1992, Ten lectures on wavelets, SIAM.
  • [7] KADOOKA K., KUNOO K., UDA N., ONO K., NAGAYASU T., 2003, Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform, Experimental Mechanics, 43/1, 45–51.
  • [8] DU P., KIBBE W.A., LIN S.M., 2006, Improved peak detection in mass spectrum by incorporating continuous wavelet transform-based pattern matching, Bioinformatics, 22/17, 2059–2065.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-c170cafe-38af-464b-b656-7f24e058b3c7
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