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Comparative Tests of Temperature Effects on the Performance of Gan and Sic Photodiodes

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
The paper presents a study of the performance of some selected UV detectors. Unlike many similar works, the obtained data refer to commercial photodiodes (not only to detector materials). The main task of the research was to determine the influence of the operating temperature and annealing on the detector spectral responsiveness. A comparison of the results obtained for the photodiodes made of GaN and SiC was also performed. Although both kinds of detectors can work at high temperatures for a long time, some modification of their properties was observed. However, for GaN and SiC photodiodes, this modification has a substantially different nature. It is very important for some applications, e.g. fire alarms and a military equipment.
Rocznik
Strony
119--126
Opis fizyczny
Bibliogr. 11 poz., fot., rys., wykr.
Twórcy
autor
  • Military University of Technology, Faculty of Electronics, Institute of Electronic Systems, S.Kaliskiego 2, 00-908 Warsaw, Poland
autor
  • Military University of Technology, Faculty of Electronics, Institute of Electronic Systems, S.Kaliskiego 2, 00-908 Warsaw, Poland
  • Military University of Technology, Institute of Optoelectronics, S.Kaliskiego 2, 00-908 Warsaw, Poland
Bibliografia
  • [1] Zgorka, G., Kawka, S. (2001). Application of conventional UV, photodiode array (PDA) and fluorescence (FL) detection to analysis of phenolic acids in plant material and pharmaceutical preparations, Journal of Pharmaceutical and Biomedical Analysis, 24 (5-6),1065-1072.
  • [2] Rogalski, A., Razeghi, M. (1996), Semiconductor ultraviolet photodetectors, J. Appl. Phys.,79 (10), DOI:0021-8979/96/79(10)/7433/41.
  • [3] Rogalski A., Chrzanowski K. (2014), Infrared Devices and techniques (revision), Metrology Measurement Systems, XXI, 4, 565-618.
  • [4] Bielecki, Z., Kolosowski, W; Dufrene, R., Sedek, E., Wojtas, J. (2004), Photoreceiver for BLU/UV detection, Proc. SPIE 5472, 383, DOI:10.1117/12.547653.
  • [5] Shur, M. S., Zakauskas, A. (2003), UV Solid-State Light Emitters and Detectors. NATO Science Series., II (144), ISBN 1-4020-2103-8 (e-book).
  • [6] Liu, H-D. (2006), Demonstration of Ultraviolet 6H-SiC PIN Avalanche Photodiodes, IEEE Photonics Technology Letters, 18 (23), 2508-2510.
  • [7] Chen, B., Yang, Y-T., Xie, X-R., Wang, N., Ma, Z-Y., Song, K., Zhang, X-J. (2012), Analysis of temperature-dependent characteristics of a 4H-SiC metal-semiconductor-metal ultraviolet photodetector, Applied Physics, 57 (34), 4427-4433, DOI: 10.1007/s11434-012-5494-3.
  • [8] Chen, C.H., Chang, S.J., Su, Y.K, Chi, G.C., Chi, J.Y., Chang, C.A., Sheu, J.K., Chen, J.F. (2001), GaN Metal-Semiconductor-Metal Ultraviolet Photodetectors With Transparent Indium-Tin-Oxide Schottky Contacts, IEEE Photonics Technology Letters, 13 (8).
  • [9] Kim, J.K., Jang, H.W., Jeon, C.M., Lee, J-L. (2002), GaN metal-semiconductor-metal ultraviolet photodetector with IrO2 Schottky contact, Appl. Phys. Lett., 81 (4655), DOI:10.1063/1.1524035.
  • [10] Iucolano, F, Roccaforte, F., Giannazzo, F., Raineri, V. (2008), Influence of high-temperature GaN annealed surface on the electrical properties of Ni/GaN Schottky contacts, J. Appl. Phys. 104 (093706), DOI:10.1063/1.3006133.
  • [11] Kirschman, R. (1999), Status of Silicon Carbide (SiC) as a WideBandgap Semiconductor for High Temperature Applications: A Review, High-Temperature Electronics, Wiley-IEEE Press, ISBN 9780470544884.
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-be2c5fec-d419-4853-ac82-862917e5af79
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