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Tytuł artykułu

Analysis of noise and non-linearity of I-V characteristics of positive temperature coefficient chip thermistors

Treść / Zawartość
Identyfikatory
Warianty tytułu
Języki publikacji
EN
Abstrakty
EN
Noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing the I-V characteristic dependent on the electric field orientation. We have found that the thermistors with high quality contacts had a linear I-V characteristic, the noise spectral density is of 1/f type and the third harmonic index is lower than 60 dB. The samples with poor quality contacts show non-linear I-V characteristics and excess noise is given by superposition of g-r and 1/fn type noises, and the third harmonic index is higher than 60 dB.
Rocznik
Strony
635--644
Opis fizyczny
Bibliogr. 16 poz., rys., wykr.
Twórcy
autor
  • EPCOS s.r.o. Šumperk, Feritová 1, 78705 Šumperk, Czech Republic
autor
  • Czech Noise Research Laboratory, Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Physics, Technicka 8, 616 00 Brno, Czech Republic
autor
  • Czech Noise Research Laboratory, Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Physics, Technicka 8, 616 00 Brno, Czech Republic
autor
  • Czech Noise Research Laboratory, Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Physics, Technicka 8, 616 00 Brno, Czech Republic
autor
  • Czech Noise Research Laboratory, Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Physics, Technicka 8, 616 00 Brno, Czech Republic
autor
  • Czech Noise Research Laboratory, Brno University of Technology, Faculty of Electrical Engineering and Communication, Department of Physics, Technicka 8, 616 00 Brno, Czech Republic
Bibliografia
  • [1] Heywang, W. (1971). Semiconducting Barium Titanate. J. of Material Science, 6, 1214-1226.
  • [2] Saburi O. (1961). Semiconducting Bodies in the Family of Barium Titanates. J. Amer. Ceram. Soc., 44, 54-63.
  • [3] Gerthsen, P., Groth, R., Hardtl, K. H., Heese, D., Reik, H. G. (1965). The small polaron problem and optical effects in barium titanate. Solid State Common. 3(8), 165-168.
  • [4] Zafar, S., Jones, R. E., Jiang, B., White, B., Chu, P., Taylor, D., Gillespie, S. (1998). Oxygen vacancy mobility determined from current measurements in thin Ba0.5Sr0.5TiO3 films. Appl. Phys. Letters, 73, 175-177.
  • [5] Berglund, C. N., Baer, W. S. (1967). Electron Transport in Single-Domain Ferroelectric Barium Titanate. Phys. Rev., 157, 358-366.
  • [6] Heywang, W. (1964). Resistivity Anomaly in Doped Barium Titanate. J. Amer. Ceram. Soc., 47, 484-490.
  • [7] Smulko, J., Olesz, M., Hasse, L., Kaczmarek, L., Lentka, G. (2012). Problems of varistor quality assessment during exploitation. Metrol. Meas. Syst., 18(2), 395-404.
  • [8] Kirby, P. L. (1960). The non-linearity of fixed resistors. Electronic Engineering, 32, 722.
  • [9] Fagerholt, P. O., Ewell, G. J. (2001). Third harmonic testing: An Initial Review. Proc. CARTS - EUROPE 2001, Copenhagen, Denmark, 221-231.
  • [10] Vandamme, L. K. J. (1994). Noise as a diagnostic tool for quality and reliability of electronic devices. IEEE Transactions on Electron Devices, 41(11), 2176-2187.
  • [11] Smulko, J., Darowicki, K. (2003). Nonlinearity of electrochemical noise caused by pitting corrosion. Journal of Electroanalytical Chemistry, 545, 59-63.
  • [12] Granqvist, C. G., Green, S., Jonson, E. K., Marsal, R., Niklasson, G. A., Roos, A., Topalian, Z., Azens, A., Georén, P., Gustavsson, G., Karmhag, R., Smulko, J., Kish, L.B. (2008). Electrochromic foil-based devices: Optical transmittance and modulation range, effect of ultraviolet irradiation, and quality assessment by 1/f current noise. Thin Solid Films, 516(17), 5921-5926.
  • [13] Sedlak, P., Tofel, P., Sedlakova, V., Majzner, J., Sikula, J., Hasse, L. (2011). Ultrasonic spectroscopy of silicon single crystal. Metrol. Meas. Syst., 18(4), 621-630.
  • [14] Koktavy, B., Sikula, J. (1979). Method of Experimental Study of Fluctuation in Semiconductors. J. Acta Phys. Slovaka, 29, 227-236.
  • [15] Sikula, J. et al. (1994). 1/f Noise in Metallic Thin Films. Proc. of 6th Quantum 1/f Noise and Other Low Frequency Fluctuations in Electronic Devices, St. Louis, MO May 1994, AIP Press, 59-64.
  • [16] Hooge, F. N. (1969). 1/f Noise is no Surface Effect. Phys. Lett. A, 29, 139.
Uwagi
EN
Research described in the paper was financially supported by the European Centres of Excellence CEITEC CZ.1.05/1.1.00/02.0068 and within the project GACR P102/11/0995 "Electron transport, Noise and Diagnostic of Schottky and Autoemission Cathodes".
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-bd2c3291-ffe4-4212-a226-e15cafb70b20
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