Multiple soft fault diagnosis of BJT circuits

• Autorzy: Tadeusiewicz M. , Hałgas S.

Identyfikatory

DOI

10.2478/mms-2014-0051

• Języki publikacji: EN

Abstrakty

EN

This paper deals with multiple soft fault diagnosis of nonlinear analog circuits comprising bipolar transistors characterized by the Ebers-Moll model. Resistances of the circuit and beta forward factor of a transistor are considered as potentially faulty parameters. The proposed diagnostic method exploits a strongly nonlinear set of algebraic type equations, which may possess multiple solutions, and is capable of finding different sets of the parameters values which meet the diagnostic test. The equations are written on the basis of node analysis and include DC voltages measured at accessible nodes, as well as some measured currents. The unknown variables are node voltages and the parameters which are considered as potentially faulty. The number of these parameters is larger than the number of the accessible nodes. To solve the set of equations the block relaxation method is used with different assignments of the variables to the blocks. Next, the solutions are corrected using the Newton-Raphson algorithm. As a result, one or more sets of the parameters values which satisfy the diagnostic test are obtained. The proposed approach is illustrated with a numerical example.

Słowa kluczowe

EN

analog circuits; BJT circuits; fault diagnosis; multiple faults

• Wydawca: Komitet Metrologii i Aparatury Naukowej PAN
• Czasopismo: Metrology and Measurement Systems
• Rocznik: 2014
• Tom: Vol. 21, nr 4
• Strony: 663--674
• Opis fizyczny: Bibliogr. 17 poz., rys., tab., wzory

Twórcy

autor

Tadeusiewicz M.

• Łódź University of Technology, ul. Stefanowskiego 18/22, 90-924 Łódź, Poland

autor

Hałgas S.

• Łódź University of Technology, ul. Stefanowskiego 18/22, 90-924 Łódź, Poland

Bibliografia

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Uwagi

EN

This work was supported by the Statutory Activities of Lodz University of Technology I12/1/DzS/2014.