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MOCVD grown MWIR HgCdTe detectors for high operation temperature conditions

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The paper reports on photoelectrical performance of the mid-wave infrared HgCdTe detector for high operating temperature condition. Detector structure was simulated with APSYS numerical platform by Crosslight Inc. The comprehensive analysis of the detector performance such as dark current, detectivity, time response vs. device architecture and applied bias has been performed. The N⁺pP⁺n⁺ HgCdTe heterostructure photodiode operating in room temperature at a wavelength range of 2.6–3.6 μm enabled to reach: detectivity ~ 8.7×10¹⁰ cmHz¹/²/W, responsivity ~ 1.72 A/W and time response ~ 145 ps(V = 200 mV).
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  • Institute of Applied Physics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
  • Vigo System S.A., 129/133 Poznańska Str., 05-850 Ożarów Mazowiecki, Poland
  • Vigo System S.A., 129/133 Poznańska Str., 05-850 Ożarów Mazowiecki, Poland
autor
  • Institute of Applied Physics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
autor
  • Institute of Applied Physics, Military University of Technology, 2 Kaliskiego Str., 00-908 Warsaw, Poland
Bibliografia
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  • 22. J. Wang, X. Chen, W. Hu, L. Wang, Y. Chen, W. Lu, and F. Xu, “Different approximation for carrier statistic in non-parabolic MWIR HgCdTe photovoltaic devices”, Proc. SPIE 8012, 80123B (2011).
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Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-b56d50fa-0017-4137-8946-a1f2a51a3e67
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