Study of crystallographic, optical and sensing properties of Na2WO4 films deposited by thermal evaporation with several thickness

• Autorzy: Abdallah B. , Kakhia M. , Abou Shaker S.

Identyfikatory

DOI

10.2478/msp-2019-0080

• Języki publikacji: EN

Abstrakty

EN

Na₂WO₄ films have been grown at 400 °C using thermal evaporation technique. Their structural properties were characterized by XRD, while their chemical composition was verified by both EDX and X-ray photoelectron spectroscopy (XPS). The evolution of crystallinity was studied as a function of film thickness that ranged from 500 nm to 3000 nm. The grain size increased with increasing film thickness. The surface morphology of the prepared films was studied using scanning electron microscope (SEM) and atomic force microscopy (AFM). It has been observed that the average transmittance of samples in the visible and near infrared range has varied from 90 % to 78 % with the film thickness. The optical band gap of the Na₂WO₄ films varied from 3.8 eV to 4.1 eV. The crystalline size increased with increasing thickness and showed better sensing response to gases. Thus, this study confirmed the possibility of using Na₂WO₄ thick films as a sensor element for detection of ethanol (C₂H₅OH), acetone (C₃H₆O) methanol (CH₃OH) and ammonia hydroxide (NH₄OH) vapor at room temperature, where thicker films exhibited sensing properties with a maximum sensitivity at 25 °C in air, especially for NH₄OH.

Słowa kluczowe

EN

sodium tungstate films; thermal evaporation; sensing properties

• Wydawca: De Gruyter
• Czasopismo: Materials Science Poland
• Rocznik: 2019
• Tom: Vol. 37, No. 4
• Strony: 590--598
• Opis fizyczny: Bibliogr. 45 poz., tab., rys.

Twórcy

autor

Abdallah B.

• Atomic Energy Commission, Department of Physics, P.O. Box 6091, Damascus, Syria

autor

Kakhia M.

• Atomic Energy Commission, Department of Physics, P.O. Box 6091, Damascus, Syria

autor

Abou Shaker S.

• Atomic Energy Commission, Department of Physics, P.O. Box 6091, Damascus, Syria

Bibliografia

• [1] SANTATO C., ULMANN M., AUGUSTYNSKI J., J. Phys. Chem. B, 5 (2001), 936.
• [2] RS C., BW F., Phys. Rev. Lett, 39 (1977), 232.
• [3] DICKENS P.G., WHITTINGHAM M.S., Q. Rev. Chem. Soc., 1 (1968), 30.
• [4] GOODENOUGH J.B., Prog. Solid. Sate Ch., 5 (1971), 145.
• [5] CLARKE R., Phys. Rev. Lett., 39 (1977), 1550.
• [6] ABDALLAH B., KAKHIA M., SHAKER S.A., Comp. Interfaces, 23 (2016), 663.
• [7] DAKHEL A.A., Mater. Res. Innov., 1 (2017), 55.
• [8] SUN H.-T., CANTALINI C., LOZZI L., PASSACANTANDO M., SANTUCCI S., PELINO M., Thin Solid Films, 1 (1996), 258.
• [9] CLIFFORD P.K., TUMA D.T., Sensor. Actuat., 3 (1982), 255.
• [10] YU-DE W., ZHAN-XIAN C., YAN-FENG L., ZHENLAI Z., XING-HUI W., Solid. State. Electron., 5 (2001), 639.
• [11] ITO K., OHGAMI T., NAKAZAWA T., Sensor. Actuat. B Chem., 3 (1993), 161.
• [12] ANDO M., SUTO S., SUZUKI T., TSUCHIDA T., NAKAYAMA C., MIURA N., YAMAZOE N., Chem. Lett., 2 (1994), 335.
• [13] CHIU H.C., TSEUNG A.C.C., Electrode. Electrochem. Solid State Lett., 2(10) (1999), 540.
• [14] QU W., WLODARSKI W., Sensor. Actuat. B Chem., 1 – 3 (2000), 4.
• [15] NAJDOSKI M.Z., TODOROVSKI T., Mater. Chem. Phys., 2 – 3 (2007), 483.
• [16] AHMAD M.Z., KANG J.H., SADEK A.Z., MOAFI A., SBERVEGLIERI G., WLODARSKI W., Procedia Engineering, 47 (2012), 358.
• [17] KANDA K., MAEKAWA T., Sensor. Actuat. B Chem., 108 (2005), 97.
• [18] PATIL P.S., B. Mater. Sci., 4 (2000), 309.
• [19] MOHAMMAD AL A., GILLET M., Thin Solid Films, 1 – 2 (2002), 302.
• [20] PONZONI A., COMINI E., FERRONI M., SBERVEGLIERI G., Thin Solid Films, 1 (2005), 81.
• [21] PATEL K., PANCHAL C., KHERAJ V., DESAI M., Mater. Chem. Phys., 1 (2009), 475.
• [22] ZHU Y.Q., HU W., HSU W.K., TERRONES M., GROBERT N., HARE J.P., KROTO H.W., WALTON D.R.M., TERRONES H., Chem. Phys. Lett., 5 – 6 (1999), 327.
• [23] MRADA O., ISMAILA I.M., ABDALLAHB B., RIHAWYA M.S., J. Optoelectron. Adv. Mat., 9 – 10 (2014), 1099
• [24] KISHI K., KIRIMURA H., FUJIMOTO Y., Surf. Sci., 3 (1987), 586.
• [25] NARASIMHAM A.J., GREEN A., MATYI R.J., KHARE P., VO T., DIEBOLD A., LABELLA V.P., AIP. Adv., 11 (2015), 117107.
• [26] KAWASAKI H., MATSUNAGA T., GUAN W., OHSHIMA T., YAGYU Y., SUDA Y., J. Plasma Fusion Res., 8 (2009), 1431.
• [27] BERTUS L.M., FAURE C., DANINE A., LABRUGERE C., CAMPET G., ROUGIER A., DUTA A., Mater. Chem. Phys., 1 (2013), 49.
• [28] ZHUIYKOV S., HAI Z., XU H., XUE C., Int. J. Mater. Metall. Eng., 1 (2017), 46.
• [29] ZHU C., OSHEROV A., PANZER M.J., Electrochim. Acta, 30 (2013), 771.
• [30] REGRAGUI M., ADDOU M., OUTZOURHIT A., IDRISSI EL E., KACHOUANE A., BOUGRINE A., Sol. Energ. Mat. Sol. C., 4 (2003), 341.
• [31] AL-KHAWAJA S., ABDALLAH B., SHAKER S.A., KAKHIA M., Comp. Interface., 3 (2015), 221.
• [32] ABDALLAH B., JAZMATIA A.K., REFAAI R., Mat. Res., 3 (2017), 607.
• [33] PRATHAP P., REVATHI N., SUBBAIAH Y.P.V., REDDY K.T.R., Phys.-Condens. Mat., 3 (2008), 035205.
• [34] WANG J., GAO L., J. Mater. Chem., 10 (2003), 2551.
• [35] RAHMANE S., DJOUADI M.A., AIDA M.S., BARREAU N., ABDALLAH B., ZOUBIR H.N., Thin Solid Films, 1 (2010), 5.
• [36] ABDALLAH B., JAZMATI A.K., KAKHIA M., Optik, 158 (2018), 1113.
• [37] RAO K.S., KANTH B.R., DEVI G.S., MUKHOPADHYAY P., J. Mater. Sci.-Mater. El, 9 (2011), 1466.
• [38] ABDALLAH B., NASRALLAH F., ALNAMA K., Mod. Phy. Lett. B, 04 (2019),
• [39] KHADAYATE R.S., WAGHULDE R.B., WANKHEDE M.G., SALI J.V., PATIL P.P., B. Mater. Sci., 2 (2007), 129.
• [40] LI X., CHANG Y., LONG Y., Mater. Sci. Eng. C, 4 (2012), 817.
• [41] LUPAN O., URSAKI V.V., CHAI G., CHOW L., EMELCHENKO G.A., TIGINYANU I.M., GRUZINTSEV A.N., REDKIN A.N., Sensor. Actuat. B Chem., 1 (2010), 56.
• [42] WONGCHOOSUK C., CHOOPUN S., TUANTRANONT A., KERDCHAROEN T., Mat. Res Innov., 13 (2009), 185.
• [43] DIGHAVKAR C., Arch. Appl. Sci. Res, 6 (2013), 96.
• [44] LU J. G., CHANG P., FAN Z., Mater. Sci. Eng. R Rep., 1 – 3 (2006), 49.
• [45] WANG F., FAN J., SUN Q., JIANG Q., CHEN S., ZHOU W., J. Nanomater, (2016), 1.

Uwagi

Opracowanie rekordu ze środków MNiSW, umowa Nr 461252 w ramach programu "Społeczna odpowiedzialność nauki" - moduł: Popularyzacja nauki i promocja sportu (2020).