Morphological, topographical and FTIR characterizations of Pd–C films

• Autorzy: Rymarczyk J. , Kamińska A. , Kęczkowska J. , Kozłowski M. , Czerwosz E.
• Języki publikacji: EN

Abstrakty

EN

The structure, topography and morphology of Pd–C films were studied by AFM (atomic force microscopy), SEM (scanning electron microscopy), Raman and FTIR (Fourier transform infrared spectroscopy) methods. It was found that an increasing content of palladium in films causes a decrease in their roughness and size of nanograins. The topography and morphology of Pd–C films depend on the content of palladium in the film, what was found from the analysis of SEM and AFM images. FTIR and Raman spectra show that the content of fullerene and palladium in the film strongly depends on technological parameters of PVD (physical vapor deposition) process.

Słowa kluczowe

EN

palladium nanocrystals; fullerene; PVD

• Wydawca: Oficyna Wydawnicza Politechniki Wrocławskiej
• Czasopismo: Optica Applicata
• Rocznik: 2013
• Tom: Vol. 43, nr 1
• Strony: 123--132
• Opis fizyczny: Bibliogr. 15 poz., rys., tab., wykr.

Twórcy

autor

Rymarczyk J.

• Tele & Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, Poland

autor

Kamińska A.

• Tele & Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, Poland

autor

Kęczkowska J.

• Kielce University of Technology, al. 1000-lecia PP 7, 25-413 Kielce, Poland

autor

Kozłowski M.

• Tele & Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, Poland

autor

Czerwosz E.

• Tele & Radio Research Institute, Ratuszowa 11, 03-450 Warsaw, Poland

Bibliografia

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