The detection of reverse accumulation effect in the positron annihilation profile of stack of aluminum and silver foils

• Autorzy: Dryzek J. , Siemek K.

Identyfikatory

DOI

10.1515/nuka-2015-0127

• Konferencja: Polish Seminar on Positron Annihilation (42 nd ; 29.06-01.07.2016 ; Lublin, Poland)
• Języki publikacji: EN

Abstrakty

EN

The implantation profile of positrons emitted from 22Na into a stack of aluminum and silver foils is the subject of the presented report. The characteristic dimple in the profile behind the Ag foil was detected. This effect arises from the differences in the linear absorption coefficient of aluminum and silver. The good agreement between the theoretical profile obtained within the multiscattering model and experimental one was achieved. The observed phenomenon can affect the positron annihilation characteristics measured for the inhomogeneous samples.

Słowa kluczowe

EN

positron implantation profile; stack of foils

• Wydawca: Institute of Nuclear Chemistry and Technology
• Czasopismo: Nukleonika
• Rocznik: 2015
• Tom: Vol. 60, No. 4, part 1
• Strony: 713--716
• Opis fizyczny: Bibliogr. 5 poz., rys.

Twórcy

autor

Dryzek J.

• Institute of Nuclear Physics of the Polish Academy of Sciences, 152 Radzikowskiego Str., 31-342 Kraków, Poland, Tel.: [phone], Fax: [phone]

autor

Siemek K.

• Institute of Nuclear Physics of the Polish Academy of Sciences, 152 Radzikowskiego Str., 31-342 Kraków, Poland, Tel.: [phone], Fax: [phone]

Bibliografia

• 1. Carron, N. J. (2007). An introduction to the passage of energetic particles through matter. New York: Taylor and Francis.
• 2. Dryzek, J., & Siemek, K. (2013). The accumulation effect of positrons in the stack of foils, detected by measurements of the positron implantation profile. J. Appl. Phys., 114, 224901–224906. DOI: 10.1063/1.4843035.
• 3. Dryzek, J., & Siemek, K. (2015). Positron accumulation effect in particles embedded in a low-density matrix. J. Appl. Phys., 117, 055901-7. DOI: 10.1063/1.4906400.
• 4. Dryzek, J. (2005). Defect depth scanning over the positron implantation profile in aluminum. Appl. Phys. A, 81, 1099–1104. DOI: 10.1007/s00339-004-2966-6.
• 5. http://www.ifj.edu.pl/~mdryzek/index.html for LYS-1 program.