Metody charakteryzowania niejednorodności rozmieszczenia elementów strukturalnych w materiałach wielofazowych

Rożniatowski, K.

Artykuł - szczegóły

Tytuł artykułu

Metody charakteryzowania niejednorodności rozmieszczenia elementów strukturalnych w materiałach wielofazowych

Autorzy

Rożniatowski K.

Identyfikatory

Warianty tytułu

Methods of the arrangement inhomogeneity characterization of the structural elements in multiphase materials

Języki publikacji

Abstrakty

W pracy przedstawiono najczęściej wykorzystywane w badaniach materiałoznawczych metody ilościowego opisu niejednorodności struktury materiałów wielofazowych. Przeglądu tego dokonano, opierając się na analizie danych literaturowych oraz wynikach badań własnych. Dokonano klasyfikacji najczęściej wyróżnianych sposobów rozmieszczenia cząstek drugiej fazy. Zdefiniowano pojęcia rozmieszczenia doskonale przypadkowego, regularnego i ze skupiskami. Omówiono podstawy oceny rozmieszczenia z wykorzystaniem funkcji kowariancji, metod skaningu systematycznego i analizy wariacyjnej, metod opartych na pomiarze odległości od najbliższego sąsiada, funkcji rozkładu radialnego oraz analizy opartej na koncepcji pól wpływów (tesselacji). Wskazano zakres wykorzystania każdej z omówionych metod. Dokonano porównania opisanych metod z punktu widzenia ich stosowalności w odniesieniu do spotykanych sposobów rozmieszczenia cząstek drugiej fazy. Zaproponowano jednoczesne stosowanie kilku metod opisu w celu obiektywnej identyfikacji typu organizacji struktury. Omówiono, na wybranych przykładach, wpływ rozmieszczenia elementów struktury na właściwości materiałów o złożonej strukturze. Wykazano celowość dalszego rozwijania metod ilościowego opisu niejednorodności struktury materiałów wielofazowych jako narzędzia pozwalającego optymalizować właściwości mechaniczne materiałów.

The paper shows methods (those most often used in materials science) of quantitative description of inhomogeneity ofnthe multiphase materials structure. The review is based on scientific publications and the author's own research. A classifications of most often distinguished second phases spatial patterns was obtained. The definitions of complete spatial randomness, regular spatial patterns and spatial patterns with clusters were analyzed, followed by description of the fundamentals of the inhomogeneity description based on covariance, systematical scanning and variance analysis, nearest neighbor distance, radial distribution function and tesselation methods. The scope of applications of all described methods were presented. A comparison of the considered procedures was obtained from the point of view of second phase spatial patterns characteristic features. Simultaneous use of a few different methods for full identification of a structure organization kind was suggested. Influence of structure elements space distribution on materials properties was described on selected examples. The need to develop methods of quantitative description of multiphase materials inhomogeneity was proven, as a useful tool for optimization of mechanical properties.

Słowa kluczowe

materiały wielofazowe mikrostruktura rozmieszczenie cząstek kowariancja tesselacja rozkład radialny skaning systematyczny

multiphase materials microstructure particles arrangement covariance tesselation radial distribution systematical scanning

Wydawca

Oficyna Wydawnicza Politechniki Warszawskiej

Czasopismo

Prace Naukowe Politechniki Warszawskiej. Inżynieria Materiałowa

Rocznik

2008

Tom

z. 22

Strony

1--90

Opis fizyczny

Bibliogr. 133 poz., tab., rys., wykr.

Twórcy

autor

Rożniatowski K.

Wydział Inżynierii Materiałowej, Politechnika Warszawska

Bibliografia

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SPIS PUBLIKACJI Z UDZIAŁEM AUTORA ZWIĄZANYCH Z TEMATYKĄ ROZPRAWY
1. K.J. Kurzydłowski, K. Rożniatowski, B. Ralph: Methods for quantifying the microstructure of ceramic matrix composites. British Ceramic Transactions, vol. 95, no. 6, 1996, s. 1-4.
2. K. Rożniatowski, G. Górny: Analiza rozłożenia drugiej fazy na przekroju materiału z wykorzystaniem funkcji kowariancji. Wiadomości Stereologiczne, grudzień 1998, s, 38-43.
3. K.J. Kurzydłowski, J. Bucki, K. Rożniatowski: Quantitative description of the microstructure of ceramic materials. Bulletin of the Polish Academy of the Sciences, vol. 47, no. 4, 1999, s. 353-364.
4. M. Rączka, G. Górny, L. Stobierski, K. Rożniatowski: Effect of carbon content on the microstructure and mechanical properties of silicon carbide based sinters. Proceedings of 6th Int. Conf.: Stereology and Image Analysis in Materials Science, Kraków, 20-23.09.2000, s. 329-336.
5. K. Rożniatowski, G. Górny, M. Rączka: The study of the homogeneity of the silicon carbide microstructure. Proceedings of 6th Int. Conf.: Stereology and Image Analysis in Materials Science, Kraków, 20-23.09.2000, s. 359-364.
6. J.J. Bucki, K. Rożniatowski, K.J. Kurzydłowski: Quantitative description of the microstructure of sintered materials. 15th Int. Plansee Seminar, Eds. G. Kneringer, P. Rodhammer, H. Wildner. Plansee Holding AG, Reutte, vol. 3, 2001, s. 147-160.
7. M. Rączka, G. Górny, L. Stobierski, K. Rożniatowski: Effect of carbon content on the microstructure and properties of silicon carbide-based sinters. Materials Characterization, 46, 2001, s. 245-249.
8. T. Wejrzanowski, K. Rożniatowski, K.J. Kurzydłowski: Computer aided description of the materials microstructure analysis of homogeneity of the spatial distribution of particles. Image Analysis and Stereology, 20 (Suppl. 1), 2001, s. 71-76.
9. K. Rożniatowski, T. Wejrzanowski, G. Górny, M. Rączka: Description of the homogeneity of materials microstructure using the computer aided analysis. Proceedings of 9th European Congress on Stereology and Image Analysis, edited by J. Chrapoński, J. Cwajna, L. Wojnar, Zakopane, 10-13 May, 2005, s. 400-406.
10. D. Pawlak, K. Kołodziejak, S. Turczynski, J. Kisielewski, K. Rożniatowski, R. Diduszko, M. Kaczkan, M. Malinowski: Self-organized, rodlike, micrometer scale microstructure of Tb3Sc2Al3O12-TbScO3:Pr eutectic. Chemistry of Materials, vol. 18, 2006, s. 2450-2457.
11. K. Rożniatowski, B. Ralph, K.J. Kurzydłowski: Quantification of the size, shape and arrangements of particles for the development of modern materials, in Foundation of Materials Design. Researeh Signpost, 2006, s. 175-194.
12. T. Wejrzanowski, W.L. Spychalski, K. Rożniatowski, K.J. Kurzydłowski: Image based analysis of complex microstructures of engineering materials. Int. J. Appl. Math. Comput. Sci., vol. 18, No 1, 2008, s. 33-39.

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