Crystal specimens thermoproperties investigation

• Autorzy: Zoriy V. , Ivakhiv O. , Kushnir Z. , Stadnyk B.
• Konferencja: Metody i technika przetwarzania sygnałów w pomiarach fizycznych / Międzynarodowe Seminarium Metrologów (IX ; 23-25.10.2001 ; Rzeszów, Polska)
• Języki publikacji: EN

Abstrakty

EN

We consider the possibility of the new materials thermoelectric properties investigation with the higher precision due to proposal way of thermo-electromotive force coefficient measuring; it's corresponding device and the automatic sensor classification procedure using initial classification and certain approximation procedures for function reconstruction between discrete points. This procedure allows gathering sensor with typical input-output functions of the given accuracy.

Słowa kluczowe

EN

thermoelectricity; electromotive force; semiconductor; crystal specimen

• Wydawca: Oficyna Wydawnicza Politechniki Rzeszowskiej
• Czasopismo: Zeszyty Naukowe Politechniki Rzeszowskiej. Elektrotechnika
• Rocznik: 2002
• Tom: z. 22 [192]
• Strony: 281--286
• Opis fizyczny: Bibliogr. 11 poz., rys.

Twórcy

autor

Zoriy V.

• National University "Lviv Polytechnic", Lviv, Ukraine

autor

Ivakhiv O.

• National University "Lviv Polytechnic", Lviv, Ukraine

autor

Kushnir Z.

• National University "Lviv Polytechnic", Lviv, Ukraine

autor

Stadnyk B.

• National University "Lviv Polytechnic", Lviv, Ukraine

• National University "Lviv Polytechnic", Lviv, Ukraine

Bibliografia

• 1. Varshava S., Bortnik H., Chekurin V. The semiconductor thread crystal thermo-electrical and dimensial effects, In the Proceedings of the 7 International Conference on Phisics and Technology of Thin Films, 1999, p.19 (in Ukrainian).
• 2. Temperature Measurements. Reference book/ Herashchenko 0., Gordov A., Yeremina A. and other. Kyiv: Naukova dumka, 1989 (in Russian).
• 3. Boltovets N., Venger E., Havrylenko V., lliyn I., Konakova R., Mitin V., Kholevchuk V:, In the Proceedings of the 6 Intemational Conference on Phisics and Technology of Thin Films, 1997, 152-153. (in Russian).
• 4. USSR Patent No No 440571.
• 5. Zoriy V., lvakhiv 0., Kushnir Z.. In Control and Measurement Technique, 1975, 18, 110-113 (in Ukrainian).
• 6. Ivakhiv O. Velgan R., In the Proceedings of the 41 International Scientific Colloquium, llmenau, Germany, 1996, 603-605.
• 7. USSR Patent N2 4915656.
• 8. Kriukov A., In "Space Investigation. Instrumentation, Coding, Data Compression", Moscow, Nauka, 1973, 9-13 (in Russian).
• 9. Lynch T. In NASA Technical Report, Washington DC NASATR-261, June, 1967.
• 10. Begota R., lvakhiv 0., Kushnir Z., Patsarniuk Ya., Tolopko Ya., In Proceedings of the lnteruniversities Conference. Riazan, Russia, 1988, 3 8-42 (in Russian).
• 11. Ivakhiv 0., Velgan R., In Measurement Technics and Metrology, 52, 1996, 137 (in Ukrainian)