On enhancing diagnostic effectiveness of autonomous test structures for digital circuits of medical devices

• Autorzy: Chodacki M.
• Języki publikacji: EN

Abstrakty

EN

The problem of reliability of medical electronic systems (EMD) controlled by a digital subsystem is discussed. The environmental security of EMD results from conformance to standards applying to design, manufacture, testing and implementation (in the USA, Department of Heath & Human Services, Food and Drug Administration and Quality System Regulation QSR [6]). These standards describe the whole life cycle of a device and apply both to hardware and software. However, it is impossible to eliminate completely all failures, faults and defects; some of them could have catastrophic effects to the environment. This is why digital circuit tests are of utmost importance to ensure reliability of digital systems, thus also proper diagnostics and care of the patient's health and life. The researches on design of more effective digital circuit self-testing and minimizing them are of particular significance in such important applications as medical procedures that use EMD.

Słowa kluczowe

EN

simulation of digital circuits; pseudorandom testing; built-in self-test

PL

symulacja układów cyfrowych; pseudolosowe testowanie; wbudowany autotest

• Wydawca: University of Silesia, Institute of Informatics, Computer Systems Department
• Czasopismo: Journal of Medical Informatics & Technologies
• Rocznik: 2010
• Tom: Vol. 16
• Strony: 51--57
• Opis fizyczny: Bibliogr. 8 poz., rys., tab.

Twórcy

autor

Chodacki M.

• University of Silesia, Institute of Informatics, 41-200 Sosnowiec, Będzińska 39, Poland

Bibliografia

• [1] BADURA D., Design techniques for self-testing circuits and boards using non-linear feedback shift registers, Scientific Work of the University of Silesia No. 1280, 1992 (in Polish).
• [2] CHODACKI M., MICHALSKI D., Genetic algorithms in pseudorandom testing of medical digital circuits, Journal of Medical Informatics & Technologies, Vol. 13, 2009, pp. 209-214.
• [3] EDCC-2 Companion Workshop on Dependable Computing, Workshop Proceedings, 1996, pp. 8-11 (in Polish).
• [4] STROUD Ch., LEE E., ABRAMOVICI M., BIST-based diagnostic of FPGA logic blocks, International Test Conference, 1997, pp. 539-547.
• [5] Safety testing of medical devices after installation or repair, Practical Electronics, 2010, pp. 70-72(in Polish).
• [6] Medical device quality systems manual, http://www.fda.gov/MedicalDevices/DeviceRegulationandGuidance/PostmarketRequirements/QualitySystemsRegulations/MedicalDeviceQualitySystemsManual/default.htm.
• [7] Using cRIO and SBRIO in a hardware centric approach to improve medical device reliability, http://zone.ni.com/devzone/cda/tut/p/id/10440.
• [8] Papers by F. Corno, http://www.cad.polito.it/FullDB/author/F.+Corno.html.