Signatures recognition method by using the normalized Levenshtein distances

• Autorzy: Doroz R. , Wróbel K. , Porwik P.
• Języki publikacji: EN

Abstrakty

EN

This study examines the effectiveness of normalized Levenshtein metrics in the process of recognition of handwritten signatures. Three methods of normalization of the Levenshtein metric were taken into consideration. In addition, it was determined, which signature features are most important during their comparisons with the use of the aforementioned metric. The following signature features were examined: coordinates of signature points, pen pressure in successive points, and different types of pen speed. The influence of individual parameters of the Levenshtein algorithm on the obtained results was also determined, and the best method of normalization was selected.

Słowa kluczowe

EN

signature recognition; dynamic features; Levenshtein distance

PL

rozpoznawanie podpisu; właściwości dynamiczne; odległość Levenshteina

• Wydawca: University of Silesia, Institute of Informatics, Computer Systems Department
• Czasopismo: Journal of Medical Informatics & Technologies
• Rocznik: 2009
• Tom: Vol. 13
• Strony: 73--77
• Opis fizyczny: Bibliogr. 11 poz., rys., tab.

Twórcy

autor

Doroz R.

• University of Silesia, Institute of Computer Science, 41-200 Sosnowiec, Będzińska 39, Poland

autor

Wróbel K.

autor

Porwik P.

Bibliografia

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• [8] PORWIK P., The Compact Three Stages Method of the Signature Recognition, Proceeding of 6th International Conference on Computer Information Systems and Industrial Management Applications (CISIM'07), pp. 282-287, 2007.
• [9] WEIGEL A., FEIN F., Normalizing the Weighted Edit Distance, Proc. 12th IAPR Int’l Conf. Pattern Recognition, vol.2, Conf. B: Computer Vision and Image Processing, pp. 399-402, 1994.
• [10] WROBEL K., DOROZ R., The new method of signature recognition based on least squares contour alignment, International Multi- Conference on Biometrics and Kansei Engineering (ICBAKE’09), pp. 80-83, 2009.
• [11] YUJIAN L., BO L., A Normalized Levenshtein Distance Metric, IEEE Trans. on Pattern Analysis and Machine Intelligence, vol. 26, no. 6, pp. 1091-1095, 2007.