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Electro-thermal Co-simulation of Ics with runtime back-annotation capability

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EN
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EN
A novel approach to logical and thermal co-simulation of ASIC circuits is presented in this paper. Numerous electro-thermal simulator implementations are present nowadays, but these simulators approach the electro-thermal simulation domain by co-simulating electronic and thermal effects at a low structural level.This approach has the advantage of being very accurate but at the expense of simulation time. In this paper an alternative way to simulate standard cell ASIC circuits electrically and thermally in a concurrent process, in RTL level is presented. Our approach considers standard cells of a digital design as basic building blocks and calculates a thermal distribution map on the surface of the chip. The temperature map is calculated from the cells' power characteristics and the switching activity of the regularly working circuit. We call the presented approach logi-thermal simulation. An implementation of the method is also presented in this paper: a new simulation software, CettTherm is under heavy development in the Department of Electron Devices at BME, Hungary.
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autor
autor
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  • Department of Electron Devices, Budapest University of Technology and Economics, Budapest, Hungary, H-1117., timar@eet.bme.hu
Bibliografia
  • [1] K. Torki and F. Ciontu, "Ic thermal map from digital and thermal simulations." in Proceedings of the 8th Therminic Workshop, Madrid, October 2002. pp. 303-308.
  • [2] V. Székely, A. Poppe, M. Rencz, A Csendes, and A. Páhi, "Electrothermal simulation: a realization by simultaneous iteration," Analog Integrated Circuits and Signal Processing, vol. 28, 1997.
  • [3] V. Székely, A. Páhi, A. Poppe, and M. Rencz. "Electro-thermal simulation with the SISSI package," Microelectronics Journal, vol. 21, pp. 21-31, 1999.
  • [4] V. Székely, A. Poppe, A. Páhi, A. Csendes, G. Hajas, and M. Rencz. "Electro-thermal and logi-thermal simulation of VLSI designs," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 5, no. 3, sep 1997.
  • [5] S. Wünsche, C. Clauß, P. Schwarz, and F. Winkler, "Electro-thermal circuit simulation using simulator coupling," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 5, no. 3, sep 1997.
  • [6] M. Rencz, V. Székely, A. Poppe, K. Torki, and B. Courtois, "Electro-thermal simulation for the prediction of chip operation within the package," 19th IEEE SEMI-THERM Symposium, 2003.
  • [7] A. Poppe, G. Horváth, G. Nagy, M. Rencz, and V. Székely, "Electro-thermal and logi-thermal simulators aimed at the temperature-a ware design of complex integrated circuits." 24th IEEE SEMI-THERM Symposium, 2008.
  • [8] W. Huang, K. Sankaranarayanan. K. Skadron, R. J. Ribando, and M. R. Stan, "Accurate pre-RTL temperature -aware design using a parameterized, geometric thermal model," IEEE Transactions on Computers, vol. 57, no. 8, August 2008.
  • [9] K. Sankaranarayanan. S. Velusamy, M. Stan, and K. Skadron, "A case for thermal-aware floorplanning at the microarchitectural level," Journal of Instruction-Level Parallelism, vol. 8, no. 1-16, 2005.
  • [10] W. Huang, S. Ghosh, S. Velusamy, K. Sankaranarayanan, K. Skadron, and M. R. Stan, "Hotspot: A compact thermal modeling methodology for early-stage vlsi design," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 14, no. 5, May 2005.
  • [11] W. Huang, M. R. Stan, K. Skadron, K. Sankaranarayanan. S. Ghosh, and S. Velusamy, "Compact thermal modeling for temperature-aware design," 41st Design Automation Conference (DAC), San Diego, CA, June 2004.
  • [12] W. Huang, M. R. Stan, K. Sankaranarayanan, R. J. Ribando, and K. Skadron, "Many-core design from a thermal perspective,'" Proceedings of the 45th ACM/IEEE Conference on Design Automation (DAC), June 2008.
  • [13] W. Huang, K. Skadron. S. Gurumurthi, R. J. Ribando, and M R. Stan, "Exploring the thermal impact on manycore processor performance," 26th IEEE SEMI-THERM Symposium, February 2010.
  • [14] V. Székely, A. Poppe, M. Rencz, M. Rosental, and T. Teszére, "Therman: a thermal simulation tool for ic chips, microstnictures and pw boards," Microelectronics Reliability, vol. 40, no. 3, pp. 517-524, 2000.
  • [15] (2010, 19th April, 15:57) FireBolt and CircuitFire. [Online]. Available: http: //www.gradient-da.com
Typ dokumentu
Bibliografia
Identyfikator YADDA
bwmeta1.element.baztech-article-LOD6-0024-0027
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