Wavelet energy-based mahalanobis distance metric for testing analog and mixed-signal circuits

• Autorzy: Spyronasios A. D. , Dimopoulos M. G. , Hatzopoulos A. A.
• Języki publikacji: EN

Abstrakty

EN

In this paper a test method based on the wavelet transformation of the measured signal, be it supply current (Ips) or output voltage (Vout) waveform, is presented. In the wavelet analysis, a Mahalanobis distance test metric is introduced utilizing information from the wavelet energies of the first decomposition level of the measured signal. The tolerance limit for the good circuit is set by statistical processing data obtained from the fault-free circuit. Simulation comparative results on benchmark circuits for testing both hard faults and parametric faults are presented showing the effectiveness of the proposed testing scheme.

Słowa kluczowe

EN

Analog and Mixed-Signal Testing; Circuit Test; wavelets; Mahalanobis distance

PL

analogowy i mieszany test sygnału; test obwodu; falki; odległość Mahalanobisa

• Wydawca: Lodz University of Technology. Department of Microelectronics and Computer Science
• Czasopismo: International Journal of Microelectronics and Computer Science
• Rocznik: 2010
• Tom: Vol. 1, nr 2
• Strony: 218--224
• Opis fizyczny: Bibliogr. 16 poz.

Twórcy

autor

Spyronasios A. D.

autor

Dimopoulos M. G.

autor

Hatzopoulos A. A.

• Dept. of Electrical and Computer Eng., Electronics Lab., Aristotle University of Thessaloniki, Thessaloniki 54124, GREECE,

Bibliografia

• [1] M. L. Bushnell, V. D. Agrawal, "Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits", Kluwer Academic Publishers, 2000.
• [2] Bell-I.M., Spinks-S.J., Dasilva-J M., "Supply Current Test of Analog and Mixed-Signal Circuits", IEE Proc. Circuits Devices and Systems, 1996, Vol. 143, Iss. 6, pp 399-407.
• [3] Plusquellic J., Singh A., Patel C. and Gattiker A., "Power supply transient signal analysis for defect-oriented test", IEEE Tran. on Computer-Aided Design of Integrated Circuits and Systems, 2003, Vol. 22, Iss 3, pp 370-374.
• [4] Dimopoulos M.G., Spyronasios A.D., Papakostas O.K., Konstantinou D.K., Hatzopoulos A.A., "Circuit Implementation of a Supply Current Spectrum Test Method", IEEE Transactions on Instrumentation and Measurement, (accepted for publication).
• [5] Krishnan, S., Doornbos, K.D., Brand, R., Kerkhoff, H.G, "Block-level Bayesian diagnosis of analogue electronic circuits", Design. Automation & Test in Europe Conference & Exhibition (DATE), Dresden, Germany, 8-12 March 2010, pp. 1767-1772.
• [6] Fang Liu, Nikolov P.K., Ozev, S., "Parametric fault diagnosis for analog circuits using a Bayesian framework", 24th IEEE Proceedings VLSI Test Symposium, (VTS), 30 April-4 May 2006, Berkeley, California, USA, pp. 272-277.
• [7] P. Kalpana, K.. Gunavathi, "A Novel Specification Based Test Pattern Generation Using Genetic Algorithm and Wavelets", Proceedings of the 18th International Conference on VLSI Design, pp. 504-507, Jan. 2005.
• [8] M. Dimopoulos, A. Spyronasios, D. Papakostas, D Konstantinou, B. Vassios, A Hatzopoulos, "Analog and Mixed-Signal Testing by Wavelet Transformations of Power Supply Current Measurements", 16th International Conference Mixed Design of Integrated Circuits and Systems, (MIXDES 2009), Łódź, Poland, June 2009, pp. 505-508.
• [9] Swarup Bhunia, Kaushik Roy, "A novel wavelet transform-based transient current analysis for fault detection and localization", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.13 n.4, p.503-507, April 2005.
• [10] Zhi-Hong Liu, "Mixed-Signal Testing of Integrated Analog Circuits and Modules", PhD dissertation, Fritz J. and Dolores H. Russ College of Engineering and Technology, Ohio University, March 1999.
• [11] G. J. McLachlan, "Mahalanobis distance," Resonance, vol. 4, no 6, pp 20-26, Jun. 1999.
• [12] J. Walker, "A Primer on Wavelets and their Scientific Applications", CRC Press, 1999.
• [13] Stephane Mallat, "A Wavelet Tour of Signal Processing", Academic Press, 1999.
• [14] Robi Polikar, "The Wavelet Tutorial", Second Edition, [online at; http: //users.rowan.edu/~polikar/WAVELETS/WTtutorial.htrnl ].
• [15] A. Papoulis, "Probability, Random Variables and Stochastic Processes", 3rd edition, McGraw-Hill, 1991.
• [16] B. Kaminska, K. Arabi, I. Bell, P. Goteti, J.L;-Huertas, B. Kim, A. Rueda, and M. Soma, "Analog and Mixed-Signal Benchmark Circuits -First Release", Proceedings of the International Test Conference (ITC'97), Washington, DC, USA, November 3-5,1997, pp. 183-190.